產品詳細資料

Technology family CD4000 Operating temperature range (°C) -55 to 125 Rating Military
Technology family CD4000 Operating temperature range (°C) -55 to 125 Rating Military
CDIP (J) 14 130.4652 mm² 19.56 x 6.67
  • Fully static operation
  • Shifting rates up to 12 MHz @ 10 V (typ.)
  • Permanent register storage with clock line high or low - no information recirculation required
  • 100% tested for quiescent current at 20 V
  • Standardized, symmetrical output characteristics
  • 5-V, 10-V, and 15-V parametric ratings
  • Maximum input current of 1 uA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
    1 V at VDD = 5 V
    2 V at VDD = 10 V
    2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' series CMOS Devices"
  • Applications
    • Serial shift registers
    • Frequency division
    • Time delay circuits
  • Fully static operation
  • Shifting rates up to 12 MHz @ 10 V (typ.)
  • Permanent register storage with clock line high or low - no information recirculation required
  • 100% tested for quiescent current at 20 V
  • Standardized, symmetrical output characteristics
  • 5-V, 10-V, and 15-V parametric ratings
  • Maximum input current of 1 uA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
    1 V at VDD = 5 V
    2 V at VDD = 10 V
    2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' series CMOS Devices"
  • Applications
    • Serial shift registers
    • Frequency division
    • Time delay circuits

CD4006B types are composed of 4 separate shift register sections: two sections of four stages and two sections of five stages with an output tap at the fourth stage. Each section has an independent single-rail data path.

A common clock signal is used for all stages. Data are shifted to the next stage on negative-going transitions of the clock. Through appropriate connections of inputs and outputs, multiple register sections of 4, 5, 8, and 9 stages or single register sections of 10, 12, 13, 14, 16, 17 and 18 stages can be implemented using one CD4006B package. Longer shift register sections can be assembled by using more than one CD4006B.

To facilitate cascading stages when clock rise and fall times are slow, an optional output (D1+4') that is delayed one-half clock-cycle, is provided (see Truth Table for Output from Term. 2).

The CD4006B types are supplied in 14-lead hermetic dual-in-line ceramic packages (D and F suffixes), 14-lead dual-in-line plastic packages (E suffix), and in chip form (H suffix).

CD4006B types are composed of 4 separate shift register sections: two sections of four stages and two sections of five stages with an output tap at the fourth stage. Each section has an independent single-rail data path.

A common clock signal is used for all stages. Data are shifted to the next stage on negative-going transitions of the clock. Through appropriate connections of inputs and outputs, multiple register sections of 4, 5, 8, and 9 stages or single register sections of 10, 12, 13, 14, 16, 17 and 18 stages can be implemented using one CD4006B package. Longer shift register sections can be assembled by using more than one CD4006B.

To facilitate cascading stages when clock rise and fall times are slow, an optional output (D1+4') that is delayed one-half clock-cycle, is provided (see Truth Table for Output from Term. 2).

The CD4006B types are supplied in 14-lead hermetic dual-in-line ceramic packages (D and F suffixes), 14-lead dual-in-line plastic packages (E suffix), and in chip form (H suffix).

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類型 標題 日期
* Data sheet CMOS 18-Stage Static Shift Register datasheet 1998年 11月 19日
Application note Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 2022年 12月 15日
Selection guide Logic Guide (Rev. AB) 2017年 6月 12日
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
User guide LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
User guide Signal Switch Data Book (Rev. A) 2003年 11月 14日
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 2001年 12月 3日

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CDIP (J) 14 Ultra Librarian

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