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SN54SC8T240-SEP

現行

具 3 態輸出的耐輻射 8 位元反相固定方向位準轉換器

立即訂購
產品規格表

SN54SC8T240-SEP

現行
產品規格表 立即訂購

產品詳細資料

Bits (#) 8 Data rate (max) (Mbps) 150 Topology Push-Pull Direction control (typ) Fixed-direction Vin (min) (V) 1.2 Vin (max) (V) 5.5 Applications GPIO Features Output enable, Partial power down (Ioff), Single supply, Vcc isolation Prop delay (ns) 8.5 Technology family LVT Supply current (max) (mA) 0.22 Rating Space Operating temperature range (°C) -55 to 125
Bits (#) 8 Data rate (max) (Mbps) 150 Topology Push-Pull Direction control (typ) Fixed-direction Vin (min) (V) 1.2 Vin (max) (V) 5.5 Applications GPIO Features Output enable, Partial power down (Ioff), Single supply, Vcc isolation Prop delay (ns) 8.5 Technology family LVT Supply current (max) (mA) 0.22 Rating Space Operating temperature range (°C) -55 to 125
TSSOP (PW) 20 41.6 mm² 6.5 x 6.4
  • Vendor item drawing available, VID V62/25630-01XE
  • Radiation - Total Ionizing Dose (TID):
    • TID characterized up to 50krad(Si)
    • TID performance assurance up to 30 krad(Si)
    • Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
  • Radiation - Single-Event Effects (SEE):
    • Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
    • Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg

  • Wide operating range of 1.2V to 5.5V

  • Single-supply voltage translator:

    • Up translation:

      • 1.2V to 1.8V

      • 1.5V to 2.5V

      • 1.8V to 3.3V

      • 3.3V to 5.0V

    • Down translation:

      • 5.0V, 3.3V, 2.5V to 1.8V
      • 5.0V, 3.3V to 2.5V
      • 5.0V to 3.3V
  • 5.5V tolerant input pins
  • Supports standard pinouts
  • Up to 150Mbps with 5V or 3.3V VCC
  • Latch-up performance exceeds 250mA per JESD 17
  • Space enhanced plastic:
    • Supports defense and aerospace applications
    • Controlled baseline
    • Au bondwire and NiPdAu lead finish
    • Meets NASA ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability
  • Vendor item drawing available, VID V62/25630-01XE
  • Radiation - Total Ionizing Dose (TID):
    • TID characterized up to 50krad(Si)
    • TID performance assurance up to 30 krad(Si)
    • Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
  • Radiation - Single-Event Effects (SEE):
    • Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
    • Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg

  • Wide operating range of 1.2V to 5.5V

  • Single-supply voltage translator:

    • Up translation:

      • 1.2V to 1.8V

      • 1.5V to 2.5V

      • 1.8V to 3.3V

      • 3.3V to 5.0V

    • Down translation:

      • 5.0V, 3.3V, 2.5V to 1.8V
      • 5.0V, 3.3V to 2.5V
      • 5.0V to 3.3V
  • 5.5V tolerant input pins
  • Supports standard pinouts
  • Up to 150Mbps with 5V or 3.3V VCC
  • Latch-up performance exceeds 250mA per JESD 17
  • Space enhanced plastic:
    • Supports defense and aerospace applications
    • Controlled baseline
    • Au bondwire and NiPdAu lead finish
    • Meets NASA ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability

The SN54SC8T240-SEP device contains eight independent inverting line drivers with 3-state outputs. Each channel performs the Boolean function Y = A in positive logic. The channels are grouped in sets of four, with one OE pin controlling each set. The outputs can be put into a hi-Z state by applying a high on the associated OE pin.

The SN54SC8T240-SEP device contains eight independent inverting line drivers with 3-state outputs. Each channel performs the Boolean function Y = A in positive logic. The channels are grouped in sets of four, with one OE pin controlling each set. The outputs can be put into a hi-Z state by applying a high on the associated OE pin.
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類型 標題 日期
* Data sheet SN54SC8T240-SEP Radiation Tolerant, Octal Inverting Buffers/Drivers with 3-State Outputs datasheet PDF | HTML 2025年 1月 21日
* Radiation & reliability report SN54SC8T240-SEP Production Flow and Reliability Report PDF | HTML 2025年 2月 21日
* Radiation & reliability report SN54SC8T240-SEP Total Ionizing Dose (TID) Report 2025年 2月 20日
* Radiation & reliability report SN54SC8T541-SEP Single Event Effects Report PDF | HTML 2025年 1月 16日

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