SN74AHC245-EP

Name: SN74AHC245-EP
Brand: TI
SKU: SN74AHC245-EP
Price: 1.019 USD

現行

具有 3 態輸出的增強型產品八路匯流排收發器

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產品規格表

document-pdfAcrobat SN74AHC245-EP datasheet (Rev. A) (英文)

SN74AHC245-EP

現行

產品規格表

立即訂購

產品詳細資料

Supply voltage (min) (V)

2

Supply voltage (max) (V)

5.5

Number of channels

8

IOL (max) (mA)

8

IOH (max) (mA)

-8

Input type

CMOS

Output type

CMOS

Features

Balanced outputs, Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Technology family

AHC

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

Supply voltage (min) (V)

2

Supply voltage (max) (V)

5.5

Number of channels

8

IOL (max) (mA)

8

IOH (max) (mA)

-8

Input type

CMOS

Output type

CMOS

Features

Balanced outputs, Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Technology family

AHC

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

SOIC (DW)

20

131.84 mm² 12.8 x 10.3

TSSOP (PW)

20

41.6 mm² 6.5 x 6.4

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Operating Range 2-V to 5.5-V V CC
Latch-Up Performance Exceeds 250 mA Per JESD 17
ESD Protection Exceeds 1000 V Per MIL-STD-833, Method 3015; Exceeds 100 V Using Machine Model (C = 200 pF, R = 0)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Operating Range 2-V to 5.5-V V CC
Latch-Up Performance Exceeds 250 mA Per JESD 17
ESD Protection Exceeds 1000 V Per MIL-STD-833, Method 3015; Exceeds 100 V Using Machine Model (C = 200 pF, R = 0)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74AHC245 octal bus transceiver is designed for asynchronous two-way communication between data buses. The control-function implementation minimizes external timing requirements.

This device allows data transmission from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at the direction-control (DIR) input. The output-enable (OE)\ input can be used to disable the device so that the buses effectively are isolated.

To ensure the high-impedance state during power up or power down, OE\ should be tied to V_CC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The SN74AHC245 octal bus transceiver is designed for asynchronous two-way communication between data buses. The control-function implementation minimizes external timing requirements.

This device allows data transmission from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at the direction-control (DIR) input. The output-enable (OE)\ input can be used to disable the device so that the buses effectively are isolated.

To ensure the high-impedance state during power up or power down, OE\ should be tied to V_CC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

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