Home Power management Power stages Gallium nitride (GaN) power stages

LMG3410R070

ACTIVE

600-V 70mΩ GaN with integrated driver and protection

Product details

VDS (max) (V) 600 RDS(on) (mΩ) 70 ID (max) (A) 12 Features Bottom-side cooled, Latched overcurrent protection, Overtemperature protection
VDS (max) (V) 600 RDS(on) (mΩ) 70 ID (max) (A) 12 Features Bottom-side cooled, Latched overcurrent protection, Overtemperature protection
VQFN (RWH) 32 64 mm² 8 x 8
  • TI GaN Process Qualified Through Accelerated Reliability In-application Hard-switching Mission Profiles
  • Enables High Density Power Conversion Designs
    • Superior System Performance Over Cascode or Stand-alone GaN FETs
    • Low Inductance 8mm x 8mm QFN Package for Ease of Design, and Layout
    • Adjustable Drive Strength for Switching Performance and EMI Control
    • Digital Fault Status Output Signal
    • Only +12 V Unregulated Supply Needed
  • Integrated Gate Driver
    • Zero Common Source Inductance
    • 20 ns Propagation Delay for MHz Operation
    • Process-tuned Gate Bias Voltage for Reliability
    • 25 to 100V/ns User Adjustable Slew Rate
  • Robust Protection
    • Requires No External Protection Components
    • Over-current Protection with <100ns Response
    • >150V/ns Slew Rate Immunity
    • Transient Overvoltage Immunity
    • Overtemperature Protection
    • UVLO Protection on All Supply Rails
  • Device Options:
    • LMG3410R070: Latched Overcurrent Protection
    • LMG3411R070: Cycle-by-cycle Overcurrent Protection
  • TI GaN Process Qualified Through Accelerated Reliability In-application Hard-switching Mission Profiles
  • Enables High Density Power Conversion Designs
    • Superior System Performance Over Cascode or Stand-alone GaN FETs
    • Low Inductance 8mm x 8mm QFN Package for Ease of Design, and Layout
    • Adjustable Drive Strength for Switching Performance and EMI Control
    • Digital Fault Status Output Signal
    • Only +12 V Unregulated Supply Needed
  • Integrated Gate Driver
    • Zero Common Source Inductance
    • 20 ns Propagation Delay for MHz Operation
    • Process-tuned Gate Bias Voltage for Reliability
    • 25 to 100V/ns User Adjustable Slew Rate
  • Robust Protection
    • Requires No External Protection Components
    • Over-current Protection with <100ns Response
    • >150V/ns Slew Rate Immunity
    • Transient Overvoltage Immunity
    • Overtemperature Protection
    • UVLO Protection on All Supply Rails
  • Device Options:
    • LMG3410R070: Latched Overcurrent Protection
    • LMG3411R070: Cycle-by-cycle Overcurrent Protection

The LMG341xR070 GaN power stage with integrated driver and protection enables designers to achieve new levels of power density and efficiency in power electronics systems. The LMG341x’s inherent advantages over silicon MOSFETs include ultra-low input and output capacitance, zero reverse recovery to reduce switching losses by as much as 80%, and low switch node ringing to reduce EMI. These advantages enable dense and efficient topologies like the totem-pole PFC.

The LMG341xR070 provides a smart alternative to traditional cascode GaN and standalone GaN FETs by integrating a unique set of features to simplify design, maximize reliability and optimize the performance of any power supply. Integrated gate drive enables 100V/ns switching with near zero Vds ringing, <100 ns current limiting self-protects against unintended shoot-through events, Overtemperature shutdown prevents thermal runaway, and system interface signals provide self-monitoring capability.

The LMG341xR070 GaN power stage with integrated driver and protection enables designers to achieve new levels of power density and efficiency in power electronics systems. The LMG341x’s inherent advantages over silicon MOSFETs include ultra-low input and output capacitance, zero reverse recovery to reduce switching losses by as much as 80%, and low switch node ringing to reduce EMI. These advantages enable dense and efficient topologies like the totem-pole PFC.

The LMG341xR070 provides a smart alternative to traditional cascode GaN and standalone GaN FETs by integrating a unique set of features to simplify design, maximize reliability and optimize the performance of any power supply. Integrated gate drive enables 100V/ns switching with near zero Vds ringing, <100 ns current limiting self-protects against unintended shoot-through events, Overtemperature shutdown prevents thermal runaway, and system interface signals provide self-monitoring capability.

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Technical documentation

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Type Title Date
* Data sheet LMG341xR070 600-V 70-mΩ GaN with Integrated Driver and Protection datasheet (Rev. F) PDF | HTML 06 Apr 2020
Technical article The benefits of GaN for battery test systems PDF | HTML 07 Oct 2022
White paper Achieving GaN Products With Lifetime Reliability PDF | HTML 02 Jun 2021
White paper 為太陽能電網增添儲能功能的四項 重要設計考量 05 May 2021
White paper Four key design considerations when adding energy storage to solar power grids 22 Mar 2021
White paper TI GaN FET와 C2000™ 실시간 MCU를 결합하여 전력 밀도가 높고 효율적인 전원 시스템 달성 18 Mar 2021
White paper 結合 TI GaN FETs 與 C2000™ 即時 MCU,實現功率密集與有效率的數位電源系統 18 Mar 2021
White paper Achieve Power-Dense and Efficient Digital Power Systems by Combining TI GaN FETs 05 Jan 2021
More literature A Generalized Approach to Determine the Switching Lifetime of a GaN FET 20 Oct 2020
Analog Design Journal Wide-bandgap semiconductors: Performance and benefits of GaN versus SiC 22 Sep 2020
Application note Thermal Considerations for Designing a GaN Power Stage (Rev. B) 04 Aug 2020
Technical article Designing highly efficient, powerful and fast EV charging stations PDF | HTML 06 Aug 2019
Technical article No avalanche? No problem! GaN FETs are surge robust PDF | HTML 03 Apr 2019
More literature GaN FET Reliability to Power-line Surges Under Use-conditions 25 Mar 2019
Application note Third quadrant operation of GaN 25 Feb 2019
Technical article Searching for the newest innovations in power? Find them at APEC PDF | HTML 09 Feb 2019
Technical article Gallium nitride: supporting applications from watts to kilowatts PDF | HTML 19 Dec 2018
White paper Direct-drive configuration for GaN devices (Rev. A) 19 Nov 2018
Application note High Voltage Half Bridge Design Guide for LMG3410 Smart GaN FET (Rev. A) 10 Nov 2018
Application brief Overcurrent Protection in High-Density GaN Power Designs 19 Oct 2018
Technical article GaN reliability standards reach milestone PDF | HTML 18 Sep 2017
Technical article Using Digital Power MCUs for Intelligent EV Battery Charging PDF | HTML 03 Jul 2017
EVM User's guide Using the LMG3410-HB-EVM Half-Bridge and LMG34XX-BB-EVM Breakout Board EVM (Rev. A) 03 May 2017
Technical article The power to innovate industrial design PDF | HTML 27 Mar 2017
Technical article The power to do even more with GaN PDF | HTML 25 Mar 2017
White paper Enabling high-voltage power delivery through the power process chain 23 Mar 2017
Technical article Power Tips: Improve power supply reliability with high voltage GaN devices PDF | HTML 03 Nov 2016
Technical article It’s hip to be square PDF | HTML 20 Oct 2016
Technical article Is integrated GaN changing the conventional wisdom? PDF | HTML 07 Oct 2016
Technical article Don't forget the gate driver: it’s the muscle PDF | HTML 20 Sep 2016
Technical article Power Tips: How GaN devices boost resonant converter efficiency PDF | HTML 25 Aug 2016
Technical article Advantages of wide band gap materials in power electronics – part 2 PDF | HTML 21 Jun 2016
Technical article From blue light to green power PDF | HTML 26 Apr 2016
More literature Product-level Reliability of GaN Devices 26 Apr 2016
White paper Application-Relevant Qualification of Emerging Semiconductor Power Devices, GaN 31 Mar 2016
Technical article Let’s GaN together, reliably PDF | HTML 22 Mar 2016
White paper Optimizing GaN performance with an integrated driver 24 Feb 2016
White paper Redefining power management through high-voltage innovation 12 Nov 2015
White paper GaN FET-Based CCM Totem-Pole Bridgeless PFC 02 Oct 2015
White paper A comprehensive methodology to qualify the reliability of GaN products 02 Mar 2015
White paper Advancing Power Supply Solutions Through the Promise of GaN 24 Feb 2015

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