SLVSIN3 May   2025 ADS9117 , ADS9118 , ADS9119

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Thermal Information
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Electrical Characteristics
    6. 6.6  Timing Requirements
    7. 6.7  Switching Characteristics
    8. 6.8  Timing Diagrams
    9. 6.9  Typical Characteristics: All Devices
    10. 6.10 Typical Characteristics: ADS9119
    11. 6.11 Typical Characteristics: ADS9118
    12. 6.12 Typical Characteristics: ADS9117
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Inputs
      2. 7.3.2 Analog Input Bandwidth
      3. 7.3.3 ADC Transfer Function
      4. 7.3.4 Reference Voltage
      5. 7.3.5 Temperature Sensor
      6. 7.3.6 Data Averaging
      7. 7.3.7 Digital Down Converter
      8. 7.3.8 Data Interface
        1. 7.3.8.1 Data Frame Width
        2. 7.3.8.2 ADC Output Data Randomizer
        3. 7.3.8.3 Synchronizing Multiple ADCs
        4. 7.3.8.4 Test Patterns for Data Interface
          1. 7.3.8.4.1 Fixed Pattern
          2. 7.3.8.4.2 Alternating Test Pattern
          3. 7.3.8.4.3 Digital Ramp
      9. 7.3.9 ADC Sampling Clock Input
    4. 7.4 Device Functional Modes
      1. 7.4.1 Reset
      2. 7.4.2 Power-Down Options
      3. 7.4.3 Normal Operation
      4. 7.4.4 Initialization Sequence
    5. 7.5 Programming
      1. 7.5.1 Register Write
      2. 7.5.2 Register Read
      3. 7.5.3 Multiple Devices: Daisy-Chain Topology for SPI Configuration
        1. 7.5.3.1 Register Write With Daisy-Chain
        2. 7.5.3.2 Register Read With Daisy-Chain
  9. 8 Register Map
    1. 8.1 Register Bank 0
    2. 8.2 Register Bank 1
    3. 8.3 Register Bank 2
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Data Acquisition (DAQ) Circuit for a ≤20kHz Input Signal Bandwidth
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
      2. 9.2.2 Data Acquisition (DAQ) Circuit for a ≤100kHz Input Signal Bandwidth
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Application Curves
      3. 9.2.3 Data Acquisition (DAQ) Circuit for a ≤1MHz Input Signal Bandwidth
        1. 9.2.3.1 Design Requirements
        2. 9.2.3.2 Application Curves
    3. 9.3 Power Supply Recommendations
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Support Resources
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Mechanical Data

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.3.8.4 Test Patterns for Data Interface

The ADS911x features test patterns (Figure 7-10) used by the host for debugging and verifying the data interface. The test patterns replace the ADC output data with predefined digital data. Enable the test patterns by configuring the corresponding register addresses 0x13 through 0x16 in bank 1.

Table 7-9 lists the test patterns supported by the ADS911x.

ADS9117 ADS9118 ADS9119 Register Bank for Test Patterns Figure 7-10 Register Bank for Test Patterns
Table 7-9 Test Pattern Configurations
ADC OUTPUTTP_ENTP_MODESECTIONRESULT
ADC conversion result0
Fixed pattern10 or 1Fixed PatternADC output = TP0
Digital ramp12Digital RampADC output = Digital ramp
Alternating test patterns13Alternating Test PatternADC output = TP0, TP1