SLUSFQ0 Data sheet

SLUSFQ0C November 2024 – September 2025 BQ27Z758

PRODUCTION DATA

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)

YAH|15

Thermal pad, mechanical data (Package|Pins)

5.5.4 Cell Sensing Output (BAT_SP, BAT_SN)

Unless otherwise noted, characteristics noted under conditions of T_A = –40 to 85℃

PARAMETER		TEST CONDITIONS	MIN	TYP	MAX	UNIT
STATIC RESPONSE
V_BUFACC	Buffer accuracy (BAT_SP – BAT_SN)	V_BAT at 1500mV and 2400mV DC, PACK-BAT_SP ≥ 200mV, BAT_SP load: Hi-Z to 1kΩ, BAT_SN load: 1kΩ to 10kΩ	1450	1500	1550	mV
V_BUFACC	Buffer accuracy (BAT_SP – BAT_SN)		2350	2400	2450	mV
V_BUFOFFS	BAT_SN common mode shift (BAT_SN – VSS)	400mV option, V_BAT = 1.5V to 2.5V	370	400	430	mV
		200mV option, V_BAT = 2.0V to 2.5V	170	200	230
		0mV option, V_BAT = 2.0V to 2.5V	–30	0	30
		600mV option, V_BAT = 2.0 to 2.5V	550	600	650
ΔV_{BUF_LINE}	Buffer line regulation	V_BAT = 1.5 to 2.5V, no load, BAT_SP – BAT_SN, V_PACK – V_BAT = 1.0V		10		mV
ΔV_{BUF_LOAD}	Buffer load regulation	V_BAT = 2.4V, load = 1mA, BAT_SP – BAT_SN, V_PACK - V_BAT = 1.0V		1.2		mV
V_RLOACC	RLO mode accuracy (BAT_SP – BAT_SN)	V_BAT = 3000mV to 5000mV DC, For stability, 0mV buffer option enabled, BAT_SP load: Hi-Z to 1kΩ, BAT_SN load: 1kΩ to 10kΩ	–7		+7	mV
V_RLOACCP	RLO mode accuracy (BAT_SP – VSS)		–5		+5
V_RLOACCN	RLO mode accuracy (BAT_SN – VSS)		–5		+5
R_{LO_SP}	BAT_SP low resistance mode	200Ω option, DSG FET = ON	160	200	260	Ω
R_{LO_SP}	BAT_SP low resistance mode	510Ω option, DSG FET = ON	459	510	561	Ω
R_{LO_SN}	BAT_SN low resistance mode	200Ω option, DSG FET = ON	160	200	260	Ω
R_{LO_SN}	BAT_SN low resistance mode	510Ω option, DSG FET = ON	459	510	561	Ω
R_{HIZ_SP}	BAT_SP high impedance mode	CHG FET = OFF	0.6	1.0	1.3	MΩ
R_{HIZ_SN}	BAT_SN high impedance mode	CHG FET = OFF	0.6	1.0	1.3	MΩ
t_{BUF_OFF}	Buffer turn-off timing ⁽¹⁾	Buffer disable timing respect to DSG FET turn-on		500		us
C_{BUF_SP}	Max external capacitance for stable operation ⁽¹⁾	BAT_SP to SRN (PACK–)			150	pF
C_{BUF_SN}	Max external capacitance for stable operation ⁽¹⁾	BAT_SN to SRN (PACK–)			150	pF
B_{BUF_BW}	Buffer unity gain bandwidth ⁽¹⁾	Buffer enabled		30		kHz
V_BCP	BAT_SP – BAT +Fault (BCP) Threshold Range⁽¹⁾	Recommended threshold range. Factory trimmed in ≈2mV steps	+100		+250	mV
V_BCP	Factory default trimmed threshold⁽³⁾	Recommended threshold range. Factory trimmed in ≈2mV steps		+200
V_{BCP_ACC}	BAT_SP – BAT +Fault Accuracy ⁽³⁾	RLO mode enabled, Step size 10mV	–10		+10
V_BDP	BAT_SP – BAT –Fault (BDP) Threshold Range⁽¹⁾	Recommended threshold range. Factory trimmed in ≈2mV steps	–250		–100	mV
V_BDP	Factory default trimmed threshold⁽³⁾	Recommended threshold range. Factory trimmed in ≈2mV steps		–200
V_{BDP_ACC}	BAT_SP – BAT –Fault Accuracy ⁽³⁾	RLO mode enabled, Step size 10mV	–10		+10
V_BCN	BAT_SN – VSS +Fault (BCN) Threshold Range⁽¹⁾	Recommended threshold range. Factory trimmed in ≈2mV steps	+100		+250	mV
V_BCN	Factory default trimmed threshold⁽³⁾	Recommended threshold range. Factory trimmed in ≈2mV steps		+200
V_{BCN_ACC}	BAT_SN – VSS +Fault Accuracy ⁽³⁾	RLO mode enabled, Step size 10mV	–10		+10
V_BDN	BAT_SN – VSS –Fault (BDN) Threshold Range⁽¹⁾	Recommended threshold range. Factory trimmed in ≈2mV steps	–250		–100	mV
V_BDN	Factory default trimmed threshold⁽³⁾	Recommended threshold range. Factory trimmed in ≈2mV steps		–200
V_{BDN_ACC}	BAT_SN – VSS –Fault Accuracy ⁽³⁾	RLO mode enabled, Step size 10mV	–10		+10
t_{LO_FAULT_DLY}	BAT_SP / BAT_SN fault comparator delay⁽¹⁾	8ms delay		8		ms
t_{LO_FAULT_DLY}	BAT_SP / BAT_SN fault comparator delay⁽¹⁾	100ms delay		100		ms
t_{LO_FAULT_STRT}	BAT_SP / BAT_SN fault restart time ⁽¹⁾⁽²⁾			1000		ms
TRANSIENT RESPONSE
V_{LOAD_SP}	BAT_SP load transient ⁽¹⁾	No load ≥ 1KΩ ≥ No load, Transition time 1μs	–300		300	mV
V_{LOAD_SN}	BAT_SN load transient ⁽¹⁾	No load ≥ 1KΩ ≥ No load, Transition time 1μs	–200		200	mV
V_{LINE_SN}	BAT_SN line transient ⁽¹⁾	VBAT = 1.5V ≥ 2.4V ≥ 1.5V, Transition slope 500mV / 10us	–30		30	mV
V_TRANS	(BAT_SP – BAT_SN) transition transient ⁽¹⁾	Firmware commanded transition from BUF mode to RLO mode	–700		50	mV

(1) Specified by Design. Not production tested.

(2) Firmware-based parameter. Not production tested.

(3) Accuracy assured by factory trim at specified default threshold. A change from the default threshold requires device calibration in the field. Refer to the BQ27Z746R1 and BQ27Z758 Technical Reference Manual.