SLVS568E January   2005  – July 2025 TLV341 , TLV341A , TLV342 , TLV342S

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information: TLV341
    5. 5.5  Thermal Information: TLV342
    6. 5.6  Thermal Information: TLV342S
    7. 5.7  Electrical Characteristics: V+ = 1.8V
    8. 5.8  Electrical Characteristics: V+ = 5V
    9. 5.9  Shutdown Characteristics: V+ = 1.8V
    10. 5.10 Shutdown Characteristics: V+ = 5V
    11. 5.11 Typical Characteristics
  7. Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 PMOS Input Stage
      2. 6.3.2 CMOS Output Stage
      3. 6.3.3 Shutdown
    4. 6.4 Device Functional Modes
  8. Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
      3. 7.2.3 Application Curve
    3. 7.3 Power Supply Recommendations
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. Device and Documentation Support
    1. 8.1 Receiving Notification of Documentation Updates
    2. 8.2 Support Resources
    3. 8.3 Trademarks
    4. 8.4 Electrostatic Discharge Caution
    5. 8.5 Glossary
  10. Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MINMAXUNIT
V+Supply voltage(2)–0.35.5V
VIDDifferential input voltage(3)±5.5V
VIInput voltage (either input or shutdown)–0.35.5V
VOOutput voltage–0.3VCC + 0.3V
TJOperating virtual-junction temperature150°C
TstgStorage temperature–65150°C
Stresses beyond those listed under Absolute Maximum Ratings can cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods can affect device reliability.
All voltage values (except differential voltages) are with respect to the network GND.
Differential voltages are at IN+ with respect to IN−.