SWRA370A September   2011  – December 2025 CC1100 , CC1101 , CC2500 , CC2510 , CC2520 , CC2530 , CC2530-RF4CE , CC2540 , CC2540T , CC2541 , CC2541-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
    1. 1.1 Acronyms
  5. 2Standards and System Requirements
    1. 2.1 Standards
    2. 2.2 Test Equipment Suppliers
    3. 2.3 Radio Certification URLs
  6. 3Test Equipment Requirements
    1. 3.1 System Setup
      1. 3.1.1 Conducted Test Systems
      2. 3.1.2 Radiated Test Systems
    2. 3.2 Initial Considerations for Testing
    3. 3.3 Testing Reminders
  7. 4Software Setup
    1. 4.1 SmartRF Studio 7
      1. 4.1.1 SmartRF Studio 7 Start-Up Window
      2. 4.1.2 SmartRF Studio 7 Modes
      3. 4.1.3 SmartRF Studio 7 Device Control Panel
      4. 4.1.4 SmartRF Studio 7 Software User Manual
    2. 4.2 SmartRF Studio 8
      1. 4.2.1 SmartRF Studio 8 Start-Up Window
      2. 4.2.2 SmartRF Studio 8 Radio Control Window
      3. 4.2.3 SmartRF Studio 8 Software User Guide
  8. 5DUT and Test Instrument Information
    1. 5.1 DUT
    2. 5.2 Test Instruments
  9. 6Clock Frequency Tuning
    1. 6.1 HF Clock Tuning Utilizing the Internal Cap Array
    2. 6.2 LF Clock Tuning
  10. 7Transmission Tests
    1. 7.1 Transmission Power
    2. 7.2 Power Spectral Density Mask
    3. 7.3 Error Vector Magnitude
    4. 7.4 Transmission Center Frequency Offset
    5. 7.5 Spurious Emissions
  11. 8Receive Testing
    1. 8.1 Receiver Sensitivity
    2. 8.2 Interference Testing
    3. 8.3 Interference Testing with RF Generator
  12.   Appendix A Offset EVM vs. EVM
  13.   B References
  14.   B Revision History

7.2 Power Spectral Density Mask

Purpose: To verify that the PSD of the DUT is able to conform to stated conformance limits.

Pass Condition: Refer to the respective standards document. Table 8-9 shows an example for the IEEE 802.15.4 standards requirements. Figure 7-4 illustrates the requirements.

Power Spectral Density Mask Requirements Figure 7-4 Power Spectral Density Mask Requirements
Table 7-3 IEEE 802.15.4 Standards Requirements (Example)
Frequency Relative Limit Absolute Limit
|f - fc | > 3.5 MHz -20 dB -30 dBm

Test Environment: Figure 7-5 shows the test setup.

Power Spectral Density Mask Test Setup Diagram Figure 7-5 Power Spectral Density Mask Test Setup Diagram
Power Spectral Density Mask Test Bench Setup Figure 7-6 Power Spectral Density Mask Test Bench Setup
Spectrum Analyzer Output from Power Spectral Density Mask Test Figure 7-7 Spectrum Analyzer Output from Power Spectral Density Mask Test

Procedure:

  • Step 1: Connect the instruments as shown on Figure 7-5and Figure 7-6.
  • Step 2: Open SmartRF Studio and select the desired frequency on RF Parameters.
  • Step 3: Through SmartRF Studio, set the EM to modulated, continuous TX mode and click start.
  • Step 4: Verify that the PSD mask conforms to the given standard on the spectrum analyzer. (Reference Figure 7-7 for an example of the results on the spectrum analyzer)
Note: To obtain true output power of the unit, add back cable loss to the measured output power.
Table 7-4 Power Spectral Sensity Mask Results
PSD Relative Limit (%) Design Specification (%) Pass/Fail?
Freq 1 (MHz) Freq 2 (MHz) Freq 3 (MHz)
1
2
Test Results: