DLPS249 December   2024 DLP991U

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  Storage Conditions
    3. 5.3  ESD Ratings
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Thermal Information
    6. 5.6  Electrical Characteristics
    7. 5.7  Switching Characteristics
    8. 5.8  Timing Requirements
    9. 5.9  System Mounting Interface Loads
    10. 5.10 Micromirror Array Physical Characteristics
    11. 5.11 Micromirror Array Optical Characteristics
    12. 5.12 Window Characteristics
    13. 5.13 Chipset Component Usage Specification
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Power Interface
      2. 6.3.2 Timing
    4. 6.4 Device Functional Modes
    5. 6.5 Optical Interface and System Image Quality Considerations
      1. 6.5.1 Numerical Aperture and Stray Light Control
      2. 6.5.2 Pupil Match
      3. 6.5.3 Illumination Overfill
    6. 6.6 DMD Temperature Calculation
      1. 6.6.1 Off-State Thermal Differential (TDELTA_MIN)
      2. 6.6.2 On-State Thermal Differential (TDELTA_MAX)
    7. 6.7 Micromirror Power Density Calculation
    8. 6.8 Micromirror Landed-On/Landed-Off Duty Cycle
      1. 6.8.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
      2. 6.8.2 Landed Duty Cycle and Useful Life of the DMD
      3. 6.8.3 Landed Duty Cycle and Operational DMD Temperature
      4. 6.8.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
    3. 7.3 DMD Die Temperature Sensing
    4. 7.4 Power Supply Recommendations
      1. 7.4.1 DMD Power Supply Power-Up Procedure
      2. 7.4.2 DMD Power Supply Power-Down Procedure
    5. 7.5 Layout
      1. 7.5.1 Layout Guidelines
        1. 7.5.1.1 PCB Design Standards
        2. 7.5.1.2 General PCB Routing
          1. 7.5.1.2.1 Trace Impedance and Routing Priority
          2. 7.5.1.2.2 Example PCB Layer Stack-Up
          3. 7.5.1.2.3 Trace Width, Spacing
          4. 7.5.1.2.4 Power and Ground Planes
          5. 7.5.1.2.5 Trace Length Matching
            1. 7.5.1.2.5.1 HSSI Input Bus Skew
            2. 7.5.1.2.5.2 Other Timing Critical Signals
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Device Nomenclature
      2. 8.1.2 Device Markings
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation
    3. 8.3 Receiving Notification of Documentation Updates
    4. 8.4 Support Resources
    5. 8.5 Trademarks
    6. 8.6 Electrostatic Discharge Caution
    7. 8.7 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information
    1. 10.1 Package Option Addendum
      1. 10.1.1 Packaging Information

5.5 Thermal Information

THERMAL METRIC DLP991U UNIT
FLV PACKAGE
321 PINS
RMAX_ARRAY_TO_CERAMIC Thermal Resistance, active area Maximum to test point 1 (TP1) (1) 0.55 °C/W
RMIN_ARRAY_TO_CERAMIC Thermal Resistance, active area Minimum to test point 1 (TP1) (1) 0.30 °C/W
(1) The DMD is designed to conduct absorbed and dissipated heat to the back of the package where it can be removed by an appropriate heat sink. The heat sink and cooling system must be capable of maintaining the package within the specified operational temperatures. The total heat load on the DMD is largely driven by the incident light absorbed by the active area; although other contributions include light energy absorbed by the window aperture and electrical power dissipation of the array. Optical systems should be designed to minimize the light energy falling outside the window clear aperture since any additional thermal load in this area can significantly degrade the reliability of the device. Refer to Figure 6-1 for TP1 location.