SBAA548A April   2022  – May 2022 ADS8588S , ADS8681 , ADS8686S , ADS8688 , ADS8688A

 

  1.   Abstract
  2.   Trademarks
  3. 1Introduction
  4. 2Circuit Design and Test System
    1. 2.1 Design Description
      1. 2.1.1 Input Protection
      2. 2.1.2 Power Supply Design and Protection
      3. 2.1.3 Digital Isolation Design
      4. 2.1.4 Component Selection and Layout Considerations
    2. 2.2 Test System
      1. 2.2.1 Reference
    3. 2.3 Standards and Test Criteria
  5. 3Test Details and Results
    1. 3.1 Electrical Fast Transients (EFT)
    2. 3.2 Electrostatic Discharge (ESD)
    3. 3.3 Surge Immunity (SI)
    4. 3.4 Conducted Immunity (CI)
    5. 3.5 Radiated Immunity (RI)
    6. 3.6 Radiated Emissions (RE)
      1.      20
  6. 4Schematics
  7. 5PCB Layouts
  8. 6Bill of Materials
  9. 7Acknowledgments
  10. 8References
  11. 9Revision History

Surge Immunity (SI)

The IEC 61000-4-5 standard details the test equipment and procedures for performing surge testing at a specific source impedance and coupling mode (line-to-line or line-to-ground). The test is to verify the EUT immunity on both power and data lines to high-energy surges caused by switching of power systems from load changes and short circuit faults, direct or indirect lighting strikes. The IEC 61000-4-5 specifies two types of combination wave generators (CWGs). The 10 μs / 700 μs CWG is specifically used to test the ports of symmetrical telecommunication lines. The 1.2 μs / 50 μs CWG is used for all other cases. The surge for all other cases combines a 1.2 μs / 50 μs (1.2-μs rising time with 50-μs pulse width) open-circuit voltage waveform and 8 μs / 20 μs (8-μs rising time with 20-μs pulse width) short-circuit current waveform. The EUT is subject to 5 positive and 5 negative surges at each rating. The surge is repeated at least once per minute. A coupling and decoupling network (CDN) is required by the surge test. The IEC 61000-4-5 defines the impedance and capacitance used in the coupling network in different cases. The EUT is tested with the surge through a coupling and decoupling network (CDN117) with a 0.5-μF capacitor and a twisted cable.

Figure 3-6 Diagram of Laboratory Setup for Surge Test

Figure 3-7 shows a photograph of the actual setup for the surge test. An oscilloscope is intended to monitor the output signal from surge signal generator during testing.

GUID-20220322-SS0I-2GXP-BHPQ-4Z1HXVKZTKQ8-low.jpgFigure 3-7 Photograph of Laboratory Setup for Surge Test

Table 3-3 shows the results of the surge test.

Table 3-3 Surge Test Result
TestStandardTypeImpedanceTest VoltageTest LevelCriterionTest Result
SurgeIEC 61000-4-5Line-to-Line42 Ω (2-Ω source impedance + 40 Ω from coupling network)500 V1APass
Line-to-Ground42 Ω (2-Ω source impedance + 40 Ω from coupling network)BPass
Line-to-Line42 Ω (2-Ω source impedance + 40 Ω from coupling network)1 kV2APass
2-Ω source impedance only(1)BPass
Line-to-Ground42 Ω (2-Ω source impedance + 40 Ω from coupling network)BPass
2-Ω source impedance only(1)BPass
The test has a higher peak current (250 A for level 1 and 500 A for level 2) and is more aggressive than other tests in the table.