SBAA548A April   2022  – May 2022 ADS8588S , ADS8681 , ADS8686S , ADS8688 , ADS8688A

 

  1.   Abstract
  2.   Trademarks
  3. 1Introduction
  4. 2Circuit Design and Test System
    1. 2.1 Design Description
      1. 2.1.1 Input Protection
      2. 2.1.2 Power Supply Design and Protection
      3. 2.1.3 Digital Isolation Design
      4. 2.1.4 Component Selection and Layout Considerations
    2. 2.2 Test System
      1. 2.2.1 Reference
    3. 2.3 Standards and Test Criteria
  5. 3Test Details and Results
    1. 3.1 Electrical Fast Transients (EFT)
    2. 3.2 Electrostatic Discharge (ESD)
    3. 3.3 Surge Immunity (SI)
    4. 3.4 Conducted Immunity (CI)
    5. 3.5 Radiated Immunity (RI)
    6. 3.6 Radiated Emissions (RE)
      1.      20
  6. 4Schematics
  7. 5PCB Layouts
  8. 6Bill of Materials
  9. 7Acknowledgments
  10. 8References
  11. 9Revision History

Table 3-7 shows the results of the radiated emission test.

Table 3-7 Radiated Emission Test Result
Test IEC Standard Test Condition Quasi-Peak Limit (QP) dBμV/m Criterion Test Result
(Pass in a Margin)
Antenna Distance Frequency Antenna Polarization

Radiated Emission (RE)

CISPR 11 for ISM

Test 1: SCLK = 10 MHz; Sampling rate = 9.7 kSPS

30–1000 MHz

Horizontal

50.5 (30–230 MHz)

A

–34.247 dB at 139.92 MHz

57.5 (230–1000 MHz)

A

–22.828 dB at 600.05 MHz

Vertical

50.5 (30–230 MHz)

A

–30.477 dB at 54.93 MHz

57.5 (230–1000 MHz)

A

–28.297 dB at 679.95 MHz

Test 2: SCLK = 50 MHz; Sampling rate = 769.23 kSPS

30–1000 MHz

Horizontal

50.5 (30–230 MHz)

A

–18.188 dB at 149.998 MHz

57.5 (230–1000 MHz)

A

–2.77 dB at 479.96 MHz

Vertical

50.5 (30–230 MHz)

A

–16.985 dB at 40.78 MHz

57.5 (230–1000 MHz)

A

–5.645 dB at 479.789 MHz

Test 3: SCLK = 10 MHz; Sampling rate = 232 kSPS

30–1000 MHz

Horizontal

50.5 (30–230 MHz)

A

–12.589 dB at 160 MHz

57.5 (230–1000 MHz)

A

–10.823 dB at 239.94 MHz

Vertical

50.5 (30–230 MHz)

A

–19.099 dB at 30 MHz

57.5 (230–1000 MHz)

A

–6.444 dB at 479.83 MHz

Note: A yellow box in the table shows the less margin to pass the test.