SLVT251 July   2026

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1System Description
    1. 1.1 Key System Specifications
  8. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Considerations
      1. 2.2.1 High-Voltage Stackable Architecture
      2. 2.2.2 Electrochemical Impedance Spectroscopy (EIS) Subsystem
      3. 2.2.3 EIS Synchronization Requirement
      4. 2.2.4 PWM Input as Crystal of the First BQ79826Z-Q1
      5. 2.2.5 Temperature Sensing and Multiplexer Network
      6. 2.2.6 Cell Balancing Circuit and Operation
      7. 2.2.7 MCU and System Control Architecture
      8. 2.2.8 Protection and On-Board Diagnostics
    3. 2.3 Highlighted Products
      1. 2.3.1 BQ79826Z-Q1
      2. 2.3.2 TMUX1308
      3. 2.3.3 TMP61
      4. 2.3.4 SN74LXC1T14
  9. 3Hardware, Software, Testing Requirements, and Test Results
    1. 3.1 Hardware Requirements
    2. 3.2 Software
    3. 3.3 Test Setup
    4. 3.4 Pack Test Results
      1. 3.4.1 Cell Voltage Reliability Test
      2. 3.4.2 EIS Measurement Repeatability
      3. 3.4.3 Pack EIS Measurement Nyquist Plot
      4. 3.4.4 Current Consumption per BQ79826Z-Q1
  10. 4Design and Documentation Support
    1. 4.1 Design Files
      1. 4.1.1 Schematics
      2. 4.1.2 BOM
      3. 4.1.3 PCB Layout Recommendations
    2. 4.2 Tools and Software
      1. 4.2.1 Tools
    3. 4.3 Documentation Support
    4. 4.4 Support Resources
    5.     Trademarks
  11. 5About the Author

Trademarks

C2000™ and TI E2E™ are trademarks of Texas Instruments.

All trademarks are the property of their respective owners.