SLVUDB5A June   2025  – November 2025

 

  1.   1
  2.   Description
  3.   Features
  4.   Applications
  5.   5
  6. 1Evaluation Module Overview
    1. 1.1 Introduction
    2. 1.2 Kit Contents
    3. 1.3 Specification
    4. 1.4 Device Information
  7. 2Hardware
    1. 2.1 General Configurations
      1. 2.1.1 Physical Access
      2. 2.1.2 Test Equipment and Setup
  8. 3Implementation Results
    1. 3.1 Test Setup and Procedures
      1. 3.1.1 Supply Ramped From 0V to 54V — Start-up
      2. 3.1.2 Power Up Into Short
      3. 3.1.3 Undervoltage Lockout
      4. 3.1.4 Overvoltage Lockout
      5. 3.1.5 Overcurrent Event
      6. 3.1.6 Output Hot Short
  9. 4Hardware Design Files
    1. 4.1 Schematics
    2. 4.2 PCB Drawings
    3. 4.3 Bill of Materials (BOM)
  10. 5Additional Information
    1. 5.1 Trademarks
  11. 6Revision History

3.1.5 Overcurrent Event

Use the following instructions to perform the persistent over-current test on the TPS1686 eFuse:

  1. Configure the jumper J2 position to the desired reference voltage for overcurrent protection as mentioned in 7.
  2. Configure the Jumper J5 position to set the required scalable fast-trip threshold (ISFT) as per 7.
  3. Set the input supply voltage VIN to 54V and the current limit of 15A.
  4. Connect the power supply between VIN2 (connector J13) and PGND (connector J11) and enable the power supply.
  5. Apply an overload in the range of IOCP <ILOAD <ISFT between VOUT2 (connector J14) and PGND (connector J12) for a time duration more than tTIMER decided by using jumper J3.
  6. Observe the waveforms using an oscilloscope.
TPS1686-87EVM Persistent Overload Performance of TPS1686 eFuse
VIN = 54V, CITIMER = 4.7nF, COUT = 100uF, RIMON = 5.6kΩ (IOCP = 10A), RIREF = 40.2kΩ (VREF = 1V), and IOUT ramped from 5A to 12A
Figure 3-6 Persistent Overload Performance of TPS1686 eFuse