SPRACC0A November   2017  – November 2020 TMS320F28075 , TMS320F28075-Q1 , TMS320F28076 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377D , TMS320F28377D-EP , TMS320F28377D-Q1 , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1

 

  1.   Trademarks
  2. 1 Introduction and Scope
  3. 2 SRAM Bit Array
  4. 3 Sources of SRAM Failures
    1. 3.1 Manufacturing Defects
      1. 3.1.1 Time Zero Fails
      2. 3.1.2 Latent Fails
    2. 3.2 Circuit Drift With Usage
    3. 3.3 Circuit Overstress
    4. 3.4 Soft Errors
      1. 3.4.1 Radioactive Events
      2. 3.4.2 Dynamic Voltage Events
      3. 3.4.3 Summary of Error Sources
  5. 4 Methods for Managing Memory Failures in Electronic Systems
    1. 4.1 Start-Up Testing
    2. 4.2 In-System Testing
    3. 4.3 Parity Detection
    4. 4.4 Error Detection and Correction (EDAC)
    5. 4.5 Redundancy
  6. 5 Comparisons and Conclusions
  7. 6  C2000 Memory Types Example
    1. 6.1 TMS320F2837xD
  8. 7 Memory Types
    1. 7.1 Dedicated RAM (Mx and Dx RAM)
    2. 7.2 Local Shared RAM (LSx RAM)
    3. 7.3 Global Shared RAM (GSx RAM)
    4. 7.4 CPU Message RAM (CPU MSGRAM)
    5. 7.5 CLA Message RAM (CLA MSGRAM)
  9. 8 Summary
  10. 9 References
  11. 10Revision History

6.1 TMS320F2837xD

The TMS320F2837xD memory type information can be found in the TMS320F2837xD Dual-Core Microcontrollers Data Manual. The Detailed Description section of the data manual contains information about the device. Section 7 contains the information from the Memory Type section of the data manual regarding which memories contain what level of protection. Subsequent sections detail each memory type.