Packaging information
| Package | Pins WSON (DSS) | 12 |
| Operating temperature range (°C) -40 to 110 |
| Package qty | Carrier 3,000 | LARGE T&R |
Features for the BQ77207
- 3-series cell to 7-series cell protection
- High-accuracy
overvoltage
protection
- ± 10 mV at 25°C
- ± 20 mV from 0°C to 60°C
- Overvoltage protection options from 3.55 V to 5.1 V
- Undervoltage protection with options from 1.0 V to 3.5 V
- Open-wire connection detection
- Overtemperature protection using NTC or PTC
- Random cell connection
- Functional safety-capable
- Fixed internal delay timers
- Fixed detections thresholds
- Fixed output drive type for each of COUT and DOUT
- Active high or active low
- Active high drive to 6 V
- Open drain with ability to be pulled up externally to VDD
- Low power consumption ICC ≈ 1 µA (VCELL(ALL) < VOV)
- Low leakage current per cell input < 100 nA with open-wire detection disabled
- Package footprint option
- 12-pin WSON with 0.5-mm lead pitch
Description for the BQ77207
The BQ77207 family of products provides a range of voltage and temperature monitoring including overvoltage (OVP), undervoltage (UVP), open wire (OW), and overtemperature (OT) protection for Li-ion battery pack systems. Each cell is monitored independently for overvoltage, undervoltage, and open-wire conditions. With the addition of an external NTC or PTC thermistor, the device can detect overtemperature conditions.
In the BQ77207 device, an internal delay timer is initiated upon detection of an overvoltage, undervoltage, open-wire, or overtemperature condition. Upon expiration of the delay timer, the respective output is triggered into its active state (either high or low, depending on the configuration).
The overvoltage triggers the COUT pin if a fault is detected, and undervoltage triggers the DOUT pin if a fault is detected. If an overtemperature or open-wire fault is detected, then both the DOUT and COUT will be triggered. For quicker production-line testing, the BQ77207 device provides a Customer Test Mode (CTM) with greatly reduced delay time.