TIC12400

• Operates with Supply Voltage (V_S) from 6.5 V to 35 V with Over-voltage and Under-voltage Warning
• Monitors up 24 Direct Switch Inputs with 10 Inputs Configurable to Monitor Switches Connected to Either Ground or Supply
• Switch Input Withstands 40 V and Reverse Supply Condition Down to -24 V
• 6 Configurable Wetting Current Settings:
  (0 mA, 1 mA, 2 mA, 5 mA, 10 mA, and 15 mA)
• Integrated 10-bit ADC for Multi-Position Analog Switch Monitoring
• Integrated Comparator with 4 Programmable Threshold for Input Monitoring
• Ultra-low Operating Current in Polling Mode:
  68 µA Typical (t_POLL = 64 ms, t_{POLL_ACT} = 128 µs,
  All 24 Inputs Active, Comparator Mode, All Switches Open)
• Interfaces Directly to MCU Using 3.3 V/5 V Serial Peripheral Interface (SPI) Protocol
• Interrupt Generation to Support Wake-Up Operation on All Inputs
• Integrated Supply and Temperature Sensing
• ±8 kV Contact Discharge ESD Protection on Input Pins per IEC 61000-4-2 With Appropriate External Components
• 38-Pin TSSOP Package

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The TIC12400 is an advanced Multiple Switch Detection Interface (MSDI) device designed to detect external switch statuses. The TIC12400 supports 24 direct inputs, with 10 inputs configurable to monitor digital I/O switches. 6 wetting current settings can be programmed for each input to support different application scenarios. The TIC12400 features an integrated 10-bit ADC to monitor multi-position analog switches and a comparator to monitor digital switches independently of the MCU. The device supports wake-up operation on all switch inputs to eliminate the need to keep the MCU active continuously, thus reducing power consumption of the system. The TIC12400 supports 2 modes of operations: continuous and polling mode. In continuous mode, wetting current is supplied continuously. In polling mode, wetting current is turned on periodically to sample the input status based on a programmable timer, thus the system power consumption is significantly reduced. The TIC12400 also offers various fault detection and diagnostic features for improved system robustness.