- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of 40°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product Change Notification
- Qualification Pedigree

- Single Supply 2.7-V to 5.5-V Operation
- ±0.4 LSB Differential Nonlinearity (DNL), ±1.5 LSB Integral Nonlinearity (INL)
- 12-Bit Parallel Interface
- Compatible With TMS320 DSP
- Internal Power On Reset
- Settling Time 1 µs Typ
- Low Power Consumption:
- 8 mW for 5-V Supply
- 4.3 mW for 3-V Supply
- Reference Input Buffers
- Voltage Output
- Monotonic Over Temperature
- Asynchronous Update
- applications
- Battery Powered Test Instruments
- Digital Offset and Gain Adjustment
- Battery Operated/Remote Industrial Controls
- Machine and Motion Control Devices
- Cordless and Wireless Telephones
- Speech Synthesis
- Communication Modulators
- Arbitrary Waveform Generation
Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.