SN55LVDS33-SP
- 400-Mbps Signaling Rate and 200-Mxfr/s Data Transfer Rate The signaling rate
of a line is the number of voltage transitions that are made per second expressed
in the units bps (bits per second). - Operates With a Single 3.3-V Supply
- –4 V to 5 V Common-Mode Input Voltage Range
- Differential Input Thresholds < ±50 mV With 50 mV of Hysteresis Over Entire
Common-Mode Input Voltage Range - Complies With TIA/EIA-644 (LVDS)
- Active Failsafe Assures a High-Level Output With No Input
- Bus-Pin ESD Protection Exceeds 15-kV HBM
- Input Remains High-Impedance On Power Down
- TTL Inputs Are 5-V Tolerant
- QML-V Qualified, SMD 5962-07248
- Military Temperature Range (–55°C to 125°C)
These LVDS data line receivers offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5-V PECL signal as well as an overall increased ground-noise tolerance. They are in industry standard footprints with integrated termination as an option.
Precise control of the differential input voltage thresholds allows for inclusion of 50 mV of input voltage hysteresis to improve noise rejection on slowly changing input signals. The input thresholds are still no more than +50 mV over the full input common-mode voltage range.
The receivers can withstand ±15-kV Human-Body Model (HBM) and ±600-V Machine Model (MM) electrostatic discharges to the receiver input pins with respect to ground without damage. This provides reliability in cabled and other connections where potentially damaging noise is always a threat.
The receivers also include a (patent pending) failsafe circuit that provides a high-level output within 600 ns after loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these fault conditions. This feature may also be used for wired-OR bus signaling. See The Active Failsafe Feature of the SN65LVDS32B application note.
The intended application and signaling technique of these devices is point-to-point baseband data transmission over controlled impedance media of approximately 100 Ω. The transmission media may be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.
The SN55LVDS33 is characterized for operation from –55°C to 125°C.
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技術資料
| 上位の文書 | タイプ | タイトル | フォーマットオプション | 最新の英語版をダウンロード | 日付 | |
|---|---|---|---|---|---|---|
| * | データシート | High-Speed Differential Receiver データシート (Rev. C) | 2012/03/01 | |||
| * | 放射線と信頼性レポート | SN55LVDS33-SP SEE Report | 2015/03/31 | |||
| * | 放射線と信頼性レポート | SN55LVDS33-SP 50-krad and 100-krad TID Report | 2015/03/31 | |||
| * | SMD | SN55LVDS33-SP SMD 5962-07248 | 2016/07/08 | |||
| セレクション・ガイド | TI Space Products (Rev. L) | 2026/03/27 | ||||
| アプリケーション概要 | QML 製品に対する DLA 承認済みの最適化内容 (Rev. C 翻訳版) | PDF | HTML | 英語版 (Rev.C) | PDF | HTML | 2025/08/18 | |
| アプリケーション・ノート | 重イオン軌道環境単一事象効果の推定 (Rev. B 翻訳版) | PDF | HTML | 英語版 (Rev.B) | PDF | HTML | 2025/07/07 | |
| その他の技術資料 | TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. B) | 2025/02/20 | ||||
| アプリケーション・ノート | Single-Event Effects Confidence Interval Calculations (Rev. A) | PDF | HTML | 2022/10/19 | |||
| アプリケーション概要 | Space-Grade, 100-krad, Isolated Serial Peripheral Interface (SPI) LVDS Circuit | PDF | HTML | 2021/06/29 | |||
| e-Book(PDF) | Radiation Handbook for Electronics (Rev. A) | 2019/05/21 |
設計と開発
その他のアイテムや必要なリソースを参照するには、以下のタイトルをクリックして詳細ページをご覧ください。
| パッケージ | ピン数 | CAD シンボル、フットプリント、および 3D モデル |
|---|---|---|
| CFP (W) | 16 | Ultra Librarian |
購入と品質
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