홈 로직 및 전압 변환 플립플롭, 래치 및 레지스터 D형 래치
홈
로직 및 전압 변환
플립플롭, 래치 및 레지스터
D형 래치

SN74ACT563

활성

3상 출력을 지원하는 8진 D형 트랜스페어런스 래치

지금 주문
데이터 시트

이 제품의 최신 버전이 있습니다

open-in-new 대안 비교
비교 대상 장치와 유사한 기능
SN74HC563 활성 3상 출력을 지원하는 8진 트랜스페어런스 D형 래치 Voltage range 2V to 6V, average propagation delay 20ns, average drive strength 8mA

SN74ACT563

활성
데이터 시트 지금 주문

제품 상세 정보

Number of channels 8 Technology family ACT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type TTL-Compatible CMOS Output type 3-State Clock frequency (max) (MHz) 90 IOL (max) (mA) 24 IOH (max) (mA) -24 Supply current (max) (µA) 40 Features Balanced outputs, Flow-through pinout, High speed (tpd 10-50ns), Inverting output, Positive input clamp diode Operating temperature range (°C) -40 to 85 Rating Catalog
Number of channels 8 Technology family ACT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type TTL-Compatible CMOS Output type 3-State Clock frequency (max) (MHz) 90 IOL (max) (mA) 24 IOH (max) (mA) -24 Supply current (max) (µA) 40 Features Balanced outputs, Flow-through pinout, High speed (tpd 10-50ns), Inverting output, Positive input clamp diode Operating temperature range (°C) -40 to 85 Rating Catalog
PDIP (N) 20 228.702 mm² 24.33 x 9.4 SOIC (DW) 20 131.84 mm² 12.8 x 10.3 TSSOP (PW) 20 41.6 mm² 6.5 x 6.4
  • 4.5-V to 5.5-V VCC Operation
  • Inputs Accept Voltages to 5.5 V
  • Max tpd of 8.5 ns at 5 V
  • Inputs Are TTL-Voltage Compatible
  • 3-State Inverted Outputs Drive Bus Lines Directly
  • Flow-Through Architecture to Optimize PCB Layout
  • 4.5-V to 5.5-V VCC Operation
  • Inputs Accept Voltages to 5.5 V
  • Max tpd of 8.5 ns at 5 V
  • Inputs Are TTL-Voltage Compatible
  • 3-State Inverted Outputs Drive Bus Lines Directly
  • Flow-Through Architecture to Optimize PCB Layout

The ’ACT563 devices are octal D-type transparent latches with 3-state outputs. When the latch-enable (LE) input is high, the Q\ outputsare set to the complements of the data (D) inputs. When LE is taken low, the Q\ outputs are latched at the inverse logic levels set up at the D inputs.

A buffered output-enable (OE)\ input places the eight outputs in either a normal logic state (high or low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased high logic level provide the capability to drive bus lines without interface or pullup components.

OE\ does not affect internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The ’ACT563 devices are octal D-type transparent latches with 3-state outputs. When the latch-enable (LE) input is high, the Q\ outputsare set to the complements of the data (D) inputs. When LE is taken low, the Q\ outputs are latched at the inverse logic levels set up at the D inputs.

A buffered output-enable (OE)\ input places the eight outputs in either a normal logic state (high or low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased high logic level provide the capability to drive bus lines without interface or pullup components.

OE\ does not affect internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
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다운로드

기술 자료

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1개 모두 보기
유형 직함 날짜
* Data sheet SN54ACT563, SN74ACT563 datasheet (Rev. B) 2002/10/08

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

지원 및 교육

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