產品詳細資料

Sample rate (max) (Msps) 1500, 3000 Resolution (bps) 8 Number of input channels 1, 2 Interface type Parallel LVDS Analog input BW (MHz) 2000 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.87 Power consumption (typ) (mW) 2000 Architecture Folding Interpolating SNR (dB) 47 ENOB (bit) 7.4 SFDR (dB) 55.5 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 300 Radiation, SEL (MeV·cm2/mg) 120
Sample rate (max) (Msps) 1500, 3000 Resolution (bps) 8 Number of input channels 1, 2 Interface type Parallel LVDS Analog input BW (MHz) 2000 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.87 Power consumption (typ) (mW) 2000 Architecture Folding Interpolating SNR (dB) 47 ENOB (bit) 7.4 SFDR (dB) 55.5 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 300 Radiation, SEL (MeV·cm2/mg) 120
CFP (NBC) 128 382.515364 mm² 19.558 x 19.558
  • Total Ionizing Dose 300 krad(Si)
  • Single Event Latch-up 120 MeV-cm2/mg
  • Single +1.9V ±0.1V Operation
  • Interleave Mode for 2x Sample Rate
  • Multiple ADC Synchronization Capability
  • Adjustment of Input Full-Scale Range, Offset and Clock Phase Adjustment
  • Choice of SDR or DDR output clocking
  • 1:1 or 1:2 Selectable Output Demux
  • Second DCLK output
  • Duty Cycle Corrected Sample Clock
  • Test pattern
  • Serial Interface for Extended Control

Key Specifications

  • Resolution 8 Bits
  • Max Conversion Rate 1.5 GSPS (min)
  • Code Error Rate 10-18 (typ)
  • ENOB at 748 MHz Input 7.2 Bits (typ)
  • DNL ±0.15 LSB (typ)
  • Power Consumption
    • Operating in 1:2 Demux Output 2.0 W (typ)
    • Power Down Mode 2.9 mW (typ)

All trademarks are the property of their respective owners.

  • Total Ionizing Dose 300 krad(Si)
  • Single Event Latch-up 120 MeV-cm2/mg
  • Single +1.9V ±0.1V Operation
  • Interleave Mode for 2x Sample Rate
  • Multiple ADC Synchronization Capability
  • Adjustment of Input Full-Scale Range, Offset and Clock Phase Adjustment
  • Choice of SDR or DDR output clocking
  • 1:1 or 1:2 Selectable Output Demux
  • Second DCLK output
  • Duty Cycle Corrected Sample Clock
  • Test pattern
  • Serial Interface for Extended Control

Key Specifications

  • Resolution 8 Bits
  • Max Conversion Rate 1.5 GSPS (min)
  • Code Error Rate 10-18 (typ)
  • ENOB at 748 MHz Input 7.2 Bits (typ)
  • DNL ±0.15 LSB (typ)
  • Power Consumption
    • Operating in 1:2 Demux Output 2.0 W (typ)
    • Power Down Mode 2.9 mW (typ)

All trademarks are the property of their respective owners.

The ADC08D1520 is an 8–Bit, dual channel, low power, high performance CMOS analog-to-digital converter that builds upon the ADC08D1000 platform. The ADC08D1520 digitizes signals to 8 bits of resolution at sample rates up to 1.7 GSPS. It has expanded features compared to the ADC08D1000, which include a test pattern output for system debug, clock phase adjust, and selectable output demultiplexer modes. Consuming a typical 2.0W in Demultiplex Mode at 1.5 GSPS from a single 1.9 Volt supply, this device is ensured to have no missing codes over the full operating temperature range. The unique folding and interpolating architecture, the fully differential comparator design, the innovative design of the internal sample-and-hold amplifier and the self-calibration scheme enable a very flat response of all dynamic parameters beyond Nyquist, producing a high 7.2 Effective Number of Bits (ENOB) with a 748 MHz input signal and a 1.5 GHz sample rate while providing a 10-18 Code Error Rate (C.E.R.) Output formatting is offset binary and the Low Voltage Differential Signaling (LVDS) digital outputs are compatible with IEEE 1596.3-1996, with the exception of an adjustable common mode voltage between 0.8V and 1.2V.

Each converter has a selectable output demultiplexer which feeds two LVDS buses. If the 1:2 Demultiplexed Mode is selected, the output data rate is reduced to half the input sample rate on each bus. When Non-Demultiplexed Mode is selected, the output data rate on channels DI and DQ are at the same rate as the input sample clock. The two converters can be interleaved and used as a single 3 GSPS ADC.

The converter typically consumes less than 2.9 mW in the Power Down Mode and is available in a 128-pin, thermally enhanced, multi-layer ceramic quad package and operates over the Military (-55°C ≤ TA ≤ +125°C) temperature range.

The ADC08D1520 is an 8–Bit, dual channel, low power, high performance CMOS analog-to-digital converter that builds upon the ADC08D1000 platform. The ADC08D1520 digitizes signals to 8 bits of resolution at sample rates up to 1.7 GSPS. It has expanded features compared to the ADC08D1000, which include a test pattern output for system debug, clock phase adjust, and selectable output demultiplexer modes. Consuming a typical 2.0W in Demultiplex Mode at 1.5 GSPS from a single 1.9 Volt supply, this device is ensured to have no missing codes over the full operating temperature range. The unique folding and interpolating architecture, the fully differential comparator design, the innovative design of the internal sample-and-hold amplifier and the self-calibration scheme enable a very flat response of all dynamic parameters beyond Nyquist, producing a high 7.2 Effective Number of Bits (ENOB) with a 748 MHz input signal and a 1.5 GHz sample rate while providing a 10-18 Code Error Rate (C.E.R.) Output formatting is offset binary and the Low Voltage Differential Signaling (LVDS) digital outputs are compatible with IEEE 1596.3-1996, with the exception of an adjustable common mode voltage between 0.8V and 1.2V.

Each converter has a selectable output demultiplexer which feeds two LVDS buses. If the 1:2 Demultiplexed Mode is selected, the output data rate is reduced to half the input sample rate on each bus. When Non-Demultiplexed Mode is selected, the output data rate on channels DI and DQ are at the same rate as the input sample clock. The two converters can be interleaved and used as a single 3 GSPS ADC.

The converter typically consumes less than 2.9 mW in the Power Down Mode and is available in a 128-pin, thermally enhanced, multi-layer ceramic quad package and operates over the Military (-55°C ≤ TA ≤ +125°C) temperature range.

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類型 標題 日期
* Data sheet ADC08D1520QML Low Power, 8-Bit, Dual 1.5 GSPS or Single 3.0 GSPS A/D Converter datasheet (Rev. O) 2013年 3月 19日
* Radiation & reliability report ADC SEU Test Method 2012年 5月 4日
* Radiation & reliability report ADC08D1520WGFQV SEU Report 2012年 5月 4日
* Radiation & reliability report ADC08D1520WGFQV TID Report 2012年 5月 4日
* Radiation & reliability report Analysis of Low Dose Rate Effects on Parasitic Bipolar Structures in CMOS Proces 2012年 5月 4日
Application brief DLA Approved Optimizations for QML Products (Rev. B) PDF | HTML 2024年 5月 17日
Selection guide TI Space Products (Rev. J) 2024年 2月 12日
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) 2023年 8月 31日
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) PDF | HTML 2022年 11月 17日
Application note Single-Event Effects Confidence Interval Calculations (Rev. A) PDF | HTML 2022年 10月 19日
E-book Radiation Handbook for Electronics (Rev. A) 2019年 5月 21日
Application note AN-1558 Clocking High-Speed A/D Converters (Rev. B) 2013年 5月 1日

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