SN54SC245-SEP
- Vendor item drawing available, VID V62/23616
- Total ionizing dose characterized at 30 krad(Si)
- Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si)
- Single-event effects (SEE) characterized:
- Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg
- Single event transient (SET) characterized to 43 MeV-cm2 /mg
- Wide operating range of 1.2 V to 5.5 V
- 5.5 V tolerant input pins
- Output drive up to 25 mA at 5-V
- Latch-up performance exceeds 250 mA per JESD 17
- Space enhanced plastic (SEP)
- Controlled baseline
- Gold bondwire
- NiPdAu lead finish
- One assembly and test site
- One fabrication site
- Military (–55°C to 125°C) temperature range
- Extended product life cycle
- Product traceability
- Meets NASAs ASTM E595 outgassing specification
SN54SC245-SEP is an octal bus transceiver with 3-state outputs. All eight channels are controlled by the direction (DIR) pin and output enable ( OE) pin. The output enable ( OE) controls all outputs in the device. When the OE pin is in the low state, the appropriate outputs as determined by the direction (DIR) pin are enabled. When the OE pin is in the high state, all outputs of the device are disabled. All disabled outputs are placed into the high-impedance state.
技術文件
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檢視所有 5 | 類型 | 標題 | 日期 | ||
|---|---|---|---|---|
| * | Data sheet | SN54SC245-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Octal Bus TransceiversWith 3-State Outputs datasheet | PDF | HTML | 2023年 8月 23日 |
| * | Radiation & reliability report | SN54SC245-SEP Single Event Latch-Up Report | PDF | HTML | 2023年 10月 17日 |
| * | Radiation & reliability report | SN54SC245-SEP Reliability Report | PDF | HTML | 2023年 8月 23日 |
| * | Radiation & reliability report | SN54SC245-SEP Total Ionizing Dose Report | PDF | HTML | 2023年 8月 16日 |
| Application brief | TI Space Enhanced Plastic Logic Overview and Applications in Low-Earth Orbit Satellite Platforms | PDF | HTML | 2024年 9月 10日 |
設計與開發
如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。
開發板
14-24-LOGIC-EVM — 適用於 14 針腳至 24 針腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產品通用評估模組
14-24-LOGIC-EVM 評估模組 (EVM) 設計用於支援任何 14 針腳至 24 針腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯裝置。
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| TSSOP (PW) | 20 | Ultra Librarian |
訂購與品質
內含資訊:
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
內含資訊:
- 晶圓廠位置
- 組裝地點