產品詳細資料

Bits (#) 8 Data rate (max) (Mbps) 200 Topology Push-Pull Vin (min) (V) 4.5 Vin (max) (V) 5.5 Vout (min) (V) 2.7 Vout (max) (V) 5.5 Applications GPIO, JTAG, SPI, UART Features Output enable Prop delay (ns) 7.8 Technology family LVC Supply current (max) (mA) 0.13 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 85
Bits (#) 8 Data rate (max) (Mbps) 200 Topology Push-Pull Vin (min) (V) 4.5 Vin (max) (V) 5.5 Vout (min) (V) 2.7 Vout (max) (V) 5.5 Applications GPIO, JTAG, SPI, UART Features Output enable Prop delay (ns) 7.8 Technology family LVC Supply current (max) (mA) 0.13 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 85
TSSOP (PW) 24 49.92 mm² (7.8 mm × 6.4 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Bidirectional Voltage Translator
  • 5.5 V on A Port and 2.7 V to 3.6 V on B Port
  • Latch-Up Performance Exceeds 250 mA Per JESD 17
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Bidirectional Voltage Translator
  • 5.5 V on A Port and 2.7 V to 3.6 V on B Port
  • Latch-Up Performance Exceeds 250 mA Per JESD 17
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

This 8-bit (octal) noninverting bus transceiver contains two separate supply rails; B port has VCCB, which is set at 3.3 V, and A port has VCCA, which is set at 5 V. This allows for translation from a 3.3-V to a 5-V environment, and vice versa.

The SN74LVC4245A is designed for asynchronous communication between data buses. The device transmits data from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at the direction-control (DIR) input. The output-enable (OE)\ input can be used to disable the device so the buses are effectively isolated.

The SN74LVC4245A pinout allows the designer to switch to a normal all-3.3-V or all-5-V 20-pin ’245 device without board re-layout. The designer uses the data paths for pins 2-11 and 14-23 of the SN74LVC4245A to align with the conventional ’245 pinout.

This 8-bit (octal) noninverting bus transceiver contains two separate supply rails; B port has VCCB, which is set at 3.3 V, and A port has VCCA, which is set at 5 V. This allows for translation from a 3.3-V to a 5-V environment, and vice versa.

The SN74LVC4245A is designed for asynchronous communication between data buses. The device transmits data from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at the direction-control (DIR) input. The output-enable (OE)\ input can be used to disable the device so the buses are effectively isolated.

The SN74LVC4245A pinout allows the designer to switch to a normal all-3.3-V or all-5-V 20-pin ’245 device without board re-layout. The designer uses the data paths for pins 2-11 and 14-23 of the SN74LVC4245A to align with the conventional ’245 pinout.

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重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 SN74LVC4245A-EP datasheet 2003/12/1
* 輻射及可靠性報告 SN74LVC4245AIPWREP Reliability Report 2011/8/26
* VID SN74LVC4245A-EP VID V6204664 2016/6/21
應用說明 Schematic Checklist - A Guide to Designing With Fixed or Direction Control Translators PDF | HTML 2024/10/2
應用說明 Schematic Checklist - A Guide to Designing with Auto-Bidirectional Translators PDF | HTML 2024/7/12
應用說明 Understanding Transient Drive Strength vs. DC Drive Strength in Level-Shifters (Rev. A) PDF | HTML 2024/7/3
選擇指南 Voltage Translation Buying Guide (Rev. A) 2021/4/15

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