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SN74LVC541A-EP

現行

具有 3 態輸出的強化型產品 8 通道、2V 至 3.6V 緩衝器

立即訂購
產品規格表

SN74LVC541A-EP

現行
產品規格表 立即訂購

產品詳細資料

Technology family LVC Number of channels 8 IOL (max) (mA) 24 Supply current (max) (µA) 10 IOH (max) (mA) -24 Input type Standard CMOS Output type 3-State Features Balanced outputs, Very high speed (tpd 5-10ns) Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 125
Technology family LVC Number of channels 8 IOL (max) (mA) 24 Supply current (max) (µA) 10 IOH (max) (mA) -24 Input type Standard CMOS Output type 3-State Features Balanced outputs, Very high speed (tpd 5-10ns) Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 125
TSSOP (PW) 20 41.6 mm² (6.5 mm × 6.4 mm) SOIC (DW) 20 131.84 mm² (12.8 mm × 10.3 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Operates From 2 V to 3.6 V
  • Inputs Accept Voltages to 5.5 V
  • Max tpd of 5.1 ns at 3.3 V
  • Typical VOLP (Output Ground Bounce)
       <0.8 V at VCC = 3.3 V, TA = 25°C
  • Typical VOHV (Output VOH Undershoot)
       >2 V at VCC = 3.3 V, TA = 25°C
  • Supports Mixed-Mode Signal Operation on All Ports (5-V Input/Output Voltage With 3.3-V VCC)
  • Ioff Supports Partial-Power-Down Mode Operation

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Operates From 2 V to 3.6 V
  • Inputs Accept Voltages to 5.5 V
  • Max tpd of 5.1 ns at 3.3 V
  • Typical VOLP (Output Ground Bounce)
       <0.8 V at VCC = 3.3 V, TA = 25°C
  • Typical VOHV (Output VOH Undershoot)
       >2 V at VCC = 3.3 V, TA = 25°C
  • Supports Mixed-Mode Signal Operation on All Ports (5-V Input/Output Voltage With 3.3-V VCC)
  • Ioff Supports Partial-Power-Down Mode Operation

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74LVC541A-EP octal buffer/driver is designed for 2.7-V to 3.6-V VCC operation.

The device is ideal for driving bus lines or buffering memory address registers.

This device features inputs and outputs on opposite sides of the package to facilitate printed circuit board layout.

The 3-state control gate is a 2-input AND gate with active-low inputs so that, if either output enable (OE1\ or OE2\) input is high, all eight outputs are in the high-impedance state.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The SN74LVC541A-EP octal buffer/driver is designed for 2.7-V to 3.6-V VCC operation.

The device is ideal for driving bus lines or buffering memory address registers.

This device features inputs and outputs on opposite sides of the package to facilitate printed circuit board layout.

The 3-state control gate is a 2-input AND gate with active-low inputs so that, if either output enable (OE1\ or OE2\) input is high, all eight outputs are in the high-impedance state.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
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重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 SN74LVC541A-EP datasheet (Rev. A) 2005/8/4
* 輻射及可靠性報告 SN74LVC541AQPWREP Reliability Report 2015/2/6
* VID SN74LVC541A-EP VID V6204666 2016/6/21

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TSSOP (PW) 20 Ultra Librarian
SOIC (DW) 20 Ultra Librarian
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