TMUX182-SEP
- VID V62/26609-01XE
- Space enhanced plastic
- Supports Defense and Aerospace Applications
- Operating temperature from –55°C to +125°C
- Controlled baseline
- Au (gold) bondwire and NiPdAu lead finish
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability
- Enhanced mold compound for low outgassing
- Meets NASA ASTM E595 outgassing specification
- Total ionizing dose characterized at 30krad (Si)
- Total ionizing dose radiation lot acceptance (TID RLAT) for every wafer lot to 30krad (Si)
- Single-event effects (SEE) characterized:
- Single event latch-up (SEL) immune to linear energy transfer (LET) = 47MeV-cm2/mg
- Single event transient (SET) characterization report available
- Single supply range: 5V to 15V
- Dual supply range: up to ±6V
- Low capacitance: 3pF
- Bidirectional signal path
- Rail-to-rail operation
- 1.8V logic compatible
- Break-before-make switching
- ESD protection HBM: 2000V
The TMUX182-SEP device is general purpose complementary metal-oxide semiconductor (CMOS) multiplexer (MUX). The device works with a single supply (5V to 15V), dual supplies (up to ±6V), or asymmetric supplies (such as VDD = 6V, VSS = –3V). The wide supply voltage range allows the devices to be used in a broad array of applications in space.
The TMUX182-SEP supports bidirectional analog signals on the source (Sx) and drain (Dx) pins ranging from VSS to VDD. All logic inputs have 1.8V logic compatible thresholds, which is compatible for both TTL and CMOS logic when operating with a valid supply voltage.
技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 日期 |
|---|---|---|---|---|
| * | Data sheet | TMUX182-SEP Radiation Tolerant 15V, 8:1, 1-Channel Multiplexer With 1.8V Logic datasheet (Rev. A) | PDF | HTML | 2026年 5月 27日 |
| * | Radiation & reliability report | TMUX182-SEP Single-Event Effects (SEE) Radiation Report | PDF | HTML | 2026年 4月 27日 |
| * | Radiation & reliability report | TMUX182-SEP Total Ionizing Dose (TID) Report | 2026年 4月 27日 | |
| * | Radiation & reliability report | TMUX182-SEP Production Flow and Reliability Report | PDF | HTML | 2026年 4月 2日 |
| Application note | Space ADC Circuit Cookbook | PDF | HTML | 2026年 5月 11日 |
設計與開發
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16DYYPWEVM — SOT-23 薄型 (DYY) 和 TSSOP (PW) 封裝的測試板
TMUXBQB-DYYEVM — 適用於 16 針腳 BQB、DYY 和 PW 封裝的通用 TMUX 評估模組
TMUXBQB-DYYEVM 可讓使用 16 接腳 TSSOP (PW)、WQFN (BQB) 和 SOT-23 THIN (DYY) 封裝的 TMUX 產品線進行快速原型設計，以及 DC 特性分析。
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| SOT-23-THN (DYY) | 16 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中的可靠性監測
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。