SLUSBV4C June   2018  – June 2025 BQ40Z80

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1  Primary (1st Level) Safety Features
      2. 6.3.2  Secondary (2nd Level) Safety Features
      3. 6.3.3  Charge Control Features
      4. 6.3.4  Gas Gauging
      5. 6.3.5  Multifunction Pins
      6. 6.3.6  Configuration
        1. 6.3.6.1 Oscillator Function
        2. 6.3.6.2 System Present Operation
        3. 6.3.6.3 Emergency Shutdown
        4. 6.3.6.4 2-Series, 3-Series, 4-Series, 5-Series, or 6-Series Cell Configuration
        5. 6.3.6.5 Cell Balancing
      7. 6.3.7  Battery Parameter Measurements
        1. 6.3.7.1 Charge and Discharge Counting
      8. 6.3.8  Lifetime Data Logging Features
      9. 6.3.9  Authentication
      10. 6.3.10 Tamper Protection
      11. 6.3.11 LED Display
      12. 6.3.12 IATA Support
      13. 6.3.13 Voltage
      14. 6.3.14 Current
      15. 6.3.15 Temperature
      16. 6.3.16 Communications
        1. 6.3.16.1 SMBus On and Off State
        2. 6.3.16.2 SBS Commands
    4. 6.4 Device Functional Modes
  8. 7 Applications and Implementation
    1. 7.1 Application Information Disclaimer
    2. 7.2 Application Information
    3. 7.3 Typical Applications
      1. 7.3.1 Design Requirements
      2. 7.3.2 Detailed Design Procedure
        1. 7.3.2.1 Using the BQ40Z80EVM with BQSTUDIO
        2. 7.3.2.2 High-Current Path
          1. 7.3.2.2.1 Protection FETs
          2. 7.3.2.2.2 Chemical Fuse
          3. 7.3.2.2.3 Lithium-Ion Cell Connections
          4. 7.3.2.2.4 Sense Resistor
          5. 7.3.2.2.5 ESD Mitigation
        3. 7.3.2.3 Gas Gauge Circuit
          1. 7.3.2.3.1 Coulomb-Counting Interface
          2. 7.3.2.3.2 Power Supply Decoupling and PBI
          3. 7.3.2.3.3 System Present
          4. 7.3.2.3.4 SMBus Communication
          5. 7.3.2.3.5 FUSE Circuitry
        4. 7.3.2.4 Secondary-Current Protection
          1. 7.3.2.4.1 Cell and Battery Inputs
          2. 7.3.2.4.2 External Cell Balancing
          3. 7.3.2.4.3 PACK and FET Control
          4. 7.3.2.4.4 Pre-Discharge Control
          5. 7.3.2.4.5 Temperature Output
          6. 7.3.2.4.6 LEDs
      3. 7.3.3 Application Curve
    4. 7.4 Power Supply Recommendations
    5. 7.5 Layout
      1. 7.5.1 Layout Guidelines
        1. 7.5.1.1 Protector FET Bypass and Pack Terminal Bypass Capacitors
        2. 7.5.1.2 ESD Spark Gap
      2. 7.5.2 Layout Examples
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Third-Party Products Disclaimer
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation
    3. 8.3 Receiving Notification of Documentation Updates
    4. 8.4 Support Resources
    5. 8.5 Trademarks
    6. 8.6 Electrostatic Discharge Caution
    7. 8.7 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.3.2 Secondary (2nd Level) Safety Features

The secondary safety features of the BQ40Z80 can be used to indicate more serious faults via the FUSE pin. This pin can be used to blow an in-line fuse to permanently disable the battery pack from charging or discharging. See the BQ40Z80 Technical Reference Manual (SLUUBT5) for detailed descriptions of each protection function.

The secondary safety features provide protection against:

  • Safety overvoltage permanent failure
  • Safety undervoltage permanent failure
  • Safety overtemperature permanent failure
  • Safety FET overtemperature permanent failure
  • Qmax imbalance permanent failure
  • Impedance imbalance permanent failure
  • Capacity degradation permanent failure
  • Cell balancing permanent failure
  • Fuse failure permanent failure
  • Voltage imbalance at rest permanent failure
  • Voltage imbalance active permanent failure
  • Charge FET permanent failure
  • Discharge FET permanent failure
  • AFE register permanent failure
  • AFE communication permanent failure
  • Second level protector permanent failure
  • Instruction flash checksum permanent failure
  • Open cell connection permanent failure
  • Data flash permanent failure
  • Open thermistor permanent failure