SNAS635F December   2013  – August 2025 LMK00334

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Requirements, Propagation Delay, and Output Skew
    7. 5.7 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1 Differential Voltage Measurement Terminology
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Crystal Power Dissipation vs RLIM
      2. 7.3.2 Clock Inputs
      3. 7.3.3 Clock Outputs
        1. 7.3.3.1 Reference Output
    4. 7.4 Device Functional Modes
      1. 7.4.1 VCC and VCCO Power Supplies
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
        1. 8.2.1.1 Driving the Clock Inputs
        2. 8.2.1.2 Crystal Interface
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Termination and Use of Clock Drivers
        2. 8.2.2.2 Termination for DC-Coupled Differential Operation
        3. 8.2.2.3 Termination for AC-Coupled Differential Operation
      3. 8.2.3 Application Curve
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 Current Consumption and Power Dissipation Calculations
        1. 8.3.1.1 Power Dissipation Example: Worst-Case Dissipation
      2. 8.3.2 Power Supply Bypassing
        1. 8.3.2.1 Power Supply Ripple Rejection
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
      3. 8.4.3 Thermal Management
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

5.4 Thermal Information

THERMAL METRIC(1)LMK00334(2)UNIT
RTV (WQFN)
32 PINS
RθJAJunction-to-ambient thermal resistance38.1°C/W
RθJC(top)Junction-to-case (top) thermal resistance7.2°C/W
RθJBJunction-to-board thermal resistance12°C/W
ψJTJunction-to-top characterization parameter0.4°C/W
ψJBJunction-to-board characterization parameter11.9°C/W
RθJC(bot)Junction-to-case (bottom) thermal resistance4.5°C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application note.
(2) Specification assumes 5 thermal vias connect the die attach pad (DAP) to the embedded copper plane on the 4-layer JEDEC board. These vias play a key role in improving the thermal performance of the package. TI recommends using the maximum number of vias in the board layout.