at TA = 25°C, AVDD = 5V,
VDD_1V8 = 1.8V, external VREF = 4.096V, and maximum throughput (unless
otherwise noted)
Figure 5-8 Typical Offset Error Distribution (LSB)
| fIN = 2kHz, SNR = 95.4dB, THD =
−120dB |
Figure 5-10 Typical FFT for fIN = 2kHz
| fIN = 1kHz, SNR = 91.7dB, THD =
−118dB |
Figure 5-12 Typical FFT for fIN = 1kHz, external VREF =
2.5V
| fIN = 100kHz, SNR = 95.1dB, THD =
−117.6dB |
Figure 5-14 Typical FFT for fIN = 100kHz
Figure 5-16 THD
vs Input Signal Frequency
Figure 5-18 SNR
vs Oversampling Ratio
Figure 5-20 INL
vs Temperature
Figure 5-22 INL,
DNL vs Reference Voltage
Figure 5-24 Gain
Error vs Temperature
Figure 5-26 THD
and SFDR vs Temperature
| See the INT_BUFFER register field
description |
Figure 5-28 Differential Analog Input Current vs Input Differential Voltage Figure 5-30 AVDD
and VDD_1V8 Current vs Temperature
Figure 5-32 IOVDD
Current vs Sample RateFigure 5-34 AVDD
Current vs AVDD Voltage With Low AVDD Figure 5-36 AVDD
and VDD_1V8 Power-Down Current vs Temperature Figure 5-38 REF_CAP vs Sample Rate With 2.5V Reference 
| Each curve corresponds to a ADS931x unit under
test. |
Figure 5-40 REFIO
Voltage vs Temperature With 4.096V Internal ReferenceFigure 5-42 VCMOUT Voltage vs Reference Voltage Figure 5-44 VCMOUT Voltage vs Temperature With 2.5V Reference