SBOK102 July   2025 INA1H94-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Irradiation Facilities and Telemetry
  7. 4Test Device and Test Board Information
    1. 4.1 Qualification Circuits and Boards
    2. 4.2 Characterization Devices and Test Board Schematics
  8. 5Results
    1. 5.1 SEL Qualification Results
    2. 5.2 SET Characterization Results: MSU FRIB Linac
    3. 5.3 Analysis
    4. 5.4 Weibull Fit
  9. 6Summary
  10.   A MSU Results Appendix
  11.   B Confidence Interval Calculations
  12.   C References

6 Summary

Single-event effects of the INA1H94-SP radiation-hardened, high common-mode voltage difference amplifier were studied. The device was shown through characterization to be latch-up immune up to surface LETEFF = 75MeV-cm2 / mg and T = 125°C.