SBOK102 July   2025 INA1H94-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Irradiation Facilities and Telemetry
  7. 4Test Device and Test Board Information
    1. 4.1 Qualification Circuits and Boards
    2. 4.2 Characterization Devices and Test Board Schematics
  8. 5Results
    1. 5.1 SEL Qualification Results
    2. 5.2 SET Characterization Results: MSU FRIB Linac
    3. 5.3 Analysis
    4. 5.4 Weibull Fit
  9. 6Summary
  10.   A MSU Results Appendix
  11.   B Confidence Interval Calculations
  12.   C References

5.4 Weibull Fit

Weibull-Fit and cross section plots for the INA1H94-SP at supply voltages of 5V and of 18V are shown in Figure 5-12 and Figure 5-13, respectively. The Weibull equation used for the fits is shown in Equation 1, and the parameters used to plot the Weibull fits are provided in Table 5-9. For each of the supply voltages, the total number of transients and the run fluences are used to calculate the mean (σMEAN), upper bound (σUB), and lower bound (σLB) cross section (as discussed in Appendix B) at 95% confidence interval. As events were still recorded as low as 1.5MeV-cm2 / mg, SET onset is assumed to fall between that point and 0MeV-cm2 / mg. For the calculations below, onset was modeled as 0MeV-cm2 / mg.

Equation 1. σ=σSAT×1-eLET-Onsetws
Cross Section and Weibull Fit for 5V SupplyFigure 5-12 Cross Section and Weibull Fit for 5V Supply
Cross Section and Weibull Fit for 18V SupplyFigure 5-13 Cross Section and Weibull Fit for 18V Supply
Table 5-7 Cross Section and Weibull Fit Data: 5V Supply
Energy (MeV-cm2 /mg)IonFluence (Ions/cm2)Total EventsσLB (cm2/ Device)σMEAN (cm2/ Device)FITResidualResidual2σUB (cm2/ Device)UB ErrorLB Error
75169Tm1.00E+0728617.166670.9884413092.86E-030.0024434.18E-041.75E-072.90E-033.33E-05-9.86E-01
60.3129Xe1.00E+0723605.250.9872727892.36E-030.0022521.09E-041.18E-082.39E-033.03E-05-9.85E-01
50.4129Xe1.00E+0721430.50.9866557512.14E-030.0020766.73E-054.52E-092.17E-032.89E-05-9.85E-01
35.686Kr1.00E+0714023.250.9834989831.40E-030.001713-3.11E-049.66E-081.43E-032.34E-05-9.82E-01
28.986Kr1.00E+0713193.750.9829897771.32E-030.001498-1.78E-043.18E-081.34E-032.27E-05-9.82E-01
23.186Kr1.00E+0712167.750.9822894251.22E-030.001279-6.23E-053.88E-091.24E-032.18E-05-9.81E-01
10.340Ar1.00E+076172.2857140.9751607056.17E-040.000664-4.70E-052.21E-096.33E-041.56E-05-9.75E-01
6.940Ar1.00E+075961.4285710.9747035225.96E-040.0004641.32E-041.75E-086.11E-041.53E-05-9.74E-01
5.340Ar1.00E+075519.8571430.9737275895.52E-040.0003641.88E-043.55E-085.67E-041.47E-05-9.73E-01
1.516O1.00E+072796.20.9632046852.80E-040.0001081.72E-042.95E-082.90E-041.05E-05-9.63E-01
Table 5-8 Cross Section and Weibull Fit Data, 18V Supply
Energy (MeV-cm2 /mg)IonFluence (Ions/cm2)Total EventsσLB (cm2/ Device)σMEAN (cm2/ Device)FITResidualResidual2σUB (cm2 / Device)UB ErrorLB Error
75169Tm1.00E+07296340.9886464732.96E-030.0025524.12E-041.7E-073.00E-033.39E-05-9.86E-01
60.3129Xe1.00E+07251180.9876710022.51E-030.0023571.55E-042.39E-082.54E-033.13E-05-9.85E-01
50.4129Xe1.00E+0723690.750.9872957222.37E-030.0021771.92E-043.7E-082.40E-033.03E-05-9.85E-01
35.686Kr1.00E+0715127.50.9841272471.51E-030.001802-2.89E-048.38E-081.54E-032.43E-05-9.83E-01
28.986Kr1.00E+07139210.9834564881.39E-030.001578-1.86E-043.47E-081.42E-032.33E-05-9.82E-01
23.186Kr1.00E+0712129.750.9822617961.21E-030.00135-1.37E-041.87E-081.23E-032.18E-05-9.81E-01
10.340Ar1.00E+076242.1428570.9753220816.24E-040.000704-7.94E-056.3E-096.40E-041.57E-05-9.75E-01
6.940Ar1.00E+075963.4285710.9747077495.96E-040.0004921.04E-041.09E-086.12E-041.53E-05-9.74E-01
5.340Ar1.00E+075118.8571430.9727222985.12E-040.0003861.26E-041.59E-085.26E-041.42E-05-9.72E-01
1.516O1.00E+071680.1250.9526771461.68E-040.0001155.33E-052.84E-091.76E-048.22E-06-9.53E-01
Table 5-9 Weibull Fit Parameters
Parameter Value for 5V Supply Value for 18V Supply
σSAT (cm2) 2.86 × 10-3 2.96 × 10-3
Onset (MeV-cm2 /mg) 0 0
w 39 38
s 1 1
Sum (Residual2) 3.786 × 10-7 4.006 × 10-7