SBOK102 July   2025 INA1H94-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Irradiation Facilities and Telemetry
  7. 4Test Device and Test Board Information
    1. 4.1 Qualification Circuits and Boards
    2. 4.2 Characterization Devices and Test Board Schematics
  8. 5Results
    1. 5.1 SEL Qualification Results
    2. 5.2 SET Characterization Results: MSU FRIB Linac
    3. 5.3 Analysis
    4. 5.4 Weibull Fit
  9. 6Summary
  10.   A MSU Results Appendix
  11.   B Confidence Interval Calculations
  12.   C References

Abstract

Studies were performed to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the INA1H94-SP radiation-hardened, high common-mode voltage difference amplifier. For device qualification, heavy ions with an LETEFF of 75MeV-cm2 / mg were used to irradiate the devices with a fluence of 1 × 107 ions / cm2. The results demonstrated that the INA1H94-SP is SEL-free up to the specified surface LETEFF = 75MeV-cm2/ mg at 125°C.

Characterization of single-event transients (SET) and correlation testing of SEL were also performed, up to a surface LETEFF = 75MeV-cm2/ mg at 125°C.