SLASEE9C September   2017  – May 2025 TPA3221

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Audio Characteristics (BTL)
    7. 6.7 Audio Characteristics (PBTL)
    8.     Typical Characteristics, BTL Configuration, AD-mode
    9.     Typical Characteristics, PBTL Configuration, AD-mode
  8. 7 Parameter Measurement Information
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagrams
    3. 8.3 Feature Description
      1. 8.3.1 Internal LDO
        1. 8.3.1.1 Input Configuration, Gain Setting And Controller/Peripheral Operation
      2. 8.3.2 Gain Setting And Controller / Peripheral Operation
      3. 8.3.3 AD-Mode and HEAD-Mode PWM Modulation
      4. 8.3.4 Oscillator
      5. 8.3.5 Input Impedance
      6. 8.3.6 Error Reporting
    4. 8.4 Device Functional Modes
      1. 8.4.1 Powering Up
        1. 8.4.1.1 Startup Ramp Time
      2. 8.4.2 Powering Down
        1. 8.4.2.1 Power Down Ramp Time
      3. 8.4.3 Device Reset
      4. 8.4.4 Device Soft Mute
      5. 8.4.5 Device Protection System
        1. 8.4.5.1 Overload and Short Circuit Current Protection
        2. 8.4.5.2 Signal Clipping and Pulse Injector
        3. 8.4.5.3 DC Speaker Protection
        4. 8.4.5.4 Pin-to-Pin Short Circuit Protection (PPSC)
        5. 8.4.5.5 Overtemperature Protection OTW and OTE
        6. 8.4.5.6 Undervoltage Protection (UVP) and Power-on Reset (POR)
        7. 8.4.5.7 Fault Handling
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Stereo BTL Application
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedures
          1. 9.2.1.2.1 Decoupling Capacitor Recommendations
          2. 9.2.1.2.2 PVDD Capacitor Recommendation
          3. 9.2.1.2.3 BST capacitors
          4. 9.2.1.2.4 PCB Material Recommendation
      2. 9.2.2 Typical Application, Differential (2N), AD-Mode PBTL (Outputs Paralleled before LC filter)
        1. 9.2.2.1 Design Requirements
      3. 9.2.3 Typical Application, Differential (2N), AD-Mode PBTL (Outputs Paralleled after LC filter)
        1. 9.2.3.1 Design Requirements
    3. 9.3 Power Supply Recommendations
      1. 9.3.1 Power Supplies
        1. 9.3.1.1 VDD Supply
        2. 9.3.1.2 AVDD and GVDD Supplies
        3. 9.3.1.3 PVDD Supply
        4. 9.3.1.4 BST Supply
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Examples
        1. 9.4.2.1 BTL Application Printed Circuit Board Layout Example
        2. 9.4.2.2 PBTL (Outputs Paralleled before LC filter) Application Printed Circuit Board Layout Example
        3. 9.4.2.3 PBTL (Outputs Paralleled after LC filter) Application Printed Circuit Board Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Community Resources
    4. 10.4 Trademarks
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

8.4.5.7 Fault Handling

If a fault situation occurs while in operation, the device acts accordingly to the fault being a global or a channel fault. A global fault is a chip-wide fault situation and causes all PWM activity of the device to be shut down, and asserts FAULT low. A global fault is a latching fault and clearing FAULT and restarting operation requires resetting the device by toggling RESET. De-asserting RESET should never be allowed with excessive system temperature, so it is advised to monitor RESET with a system microcontroller and only release RESET ( RESET high) if the OTW_CLIP signal is cleared (high). A channel fault results in shutdown of the PWM activity of the affected channel(s). Note that asserting RESET low forces the FAULT signal high, independent of faults being present.

Table 8-5 Error Reporting
Fault/EventFault/Event DescriptionGlobal or ChannelReporting MethodLatched/Self ClearingAction needed to ClearOutput FETs
PVDD_X UVPVoltage FaultGlobalFAULT pinSelf ClearingIncrease affected supply voltageHI-Z
AVDD UVP
POR (AVDD UVP)Power On ResetGlobalFAULT pinSelf ClearingAllow AVDD to riseHI-Z
OTWThermal WarningGlobalOTW_CLIP pinSelf ClearingCool below OTW thresholdNormal operation
OTEThermal ShutdownGlobalFAULT pinLatchedToggle RESETHI-Z
OLP (CB3C>1.7 ms)OC ShutdownChannelFAULT pinLatchedToggle RESETHI-Z
CB3COC LimitingChannelNoneSelf ClearingReduce signal level or remove shortFlip state, cycle by cycle at fs/3
Stuck at Fault(1)No OSC_IO activity in Peripheral ModeGlobalNoneSelf ClearingResume OSC_IO activityHI-Z
(1) Stuck at Fault occurs when input OSC_IO input signal frequency drops below minimum frequency given in the Electrical Characteristics table of this data sheet.