SLDS216B December   2017  – February 2025 PGA302

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Overvoltage and Reverse Voltage Protection
    6. 5.6  Linear Regulators
    7. 5.7  Internal Reference
    8. 5.8  Internal Oscillator
    9. 5.9  Bridge Sensor Supply
    10. 5.10 Temperature Sensor Supply
    11. 5.11 Bridge Offset Cancel
    12. 5.12 P Gain and T Gain Input Amplifiers (Chopper Stabilized)
    13. 5.13 Analog-to-Digital Converter
    14. 5.14 Internal Temperature Sensor
    15. 5.15 Bridge Current Measurement
    16. 5.16 One Wire Interface
    17. 5.17 DAC Output
    18. 5.18 DAC Gain for DAC Output
    19. 5.19 Non-Volatile Memory
    20. 5.20 Diagnostics - PGA30x
    21. 5.21 Typical Characteristics
  7. Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1  Overvoltage and Reverse Voltage Protection
      2. 6.3.2  Linear Regulators
      3. 6.3.3  Internal Reference
      4. 6.3.4  Internal Oscillator
      5. 6.3.5  VBRGP and VBRGN Supply for Resistive Bridge
      6. 6.3.6  ITEMP Supply for Temperature Sensor
      7. 6.3.7  P Gain
      8. 6.3.8  T Gain
      9. 6.3.9  Bridge Offset Cancel
      10. 6.3.10 Analog-to-Digital Converter
        1. 6.3.10.1 Sigma Delta Modulator for ADC
        2. 6.3.10.2 Decimation Filter for ADC
        3. 6.3.10.3 Internal Temperature Sensor ADC Conversion
        4. 6.3.10.4 ADC Scan Mode
          1. 6.3.10.4.1 P-T Multiplexer Timing in Auto Scan Mode
      11. 6.3.11 Internal Temperature Sensor
      12. 6.3.12 Bridge Current Measurement
      13. 6.3.13 Digital Interface
      14. 6.3.14 OWI
        1. 6.3.14.1 Overview of OWI Interface
        2. 6.3.14.2 Activating and Deactivating the OWI Interface
          1. 6.3.14.2.1 Activating OWI Communication
          2. 6.3.14.2.2 Deactivating OWI Communication
        3. 6.3.14.3 OWI Protocol
          1. 6.3.14.3.1 OWI Frame Structure
            1. 6.3.14.3.1.1 Standard field structure:
            2. 6.3.14.3.1.2 Frame Structure
            3. 6.3.14.3.1.3 Sync Field
            4. 6.3.14.3.1.4 Command Field
            5. 6.3.14.3.1.5 Data Field(s)
          2. 6.3.14.3.2 OWI Commands
            1. 6.3.14.3.2.1 OWI Write Command
            2. 6.3.14.3.2.2 OWI Read Initialization Command
            3. 6.3.14.3.2.3 OWI Read Response Command
            4. 6.3.14.3.2.4 OWI Burst Write Command (EEPROM Cache Access)
            5. 6.3.14.3.2.5 OWI Burst Read Command (EEPROM Cache Access)
          3. 6.3.14.3.3 OWI Operations
            1. 6.3.14.3.3.1 Write Operation
            2. 6.3.14.3.3.2 Read Operation
            3. 6.3.14.3.3.3 EEPROM Burst Write
            4. 6.3.14.3.3.4 EEPROM Burst Read
        4. 6.3.14.4 OWI Communication Error Status
      15. 6.3.15 I2C Interface
        1. 6.3.15.1 Overview of I2C Interface
        2. 6.3.15.2 I2C Interface Protocol
        3. 6.3.15.3 Clocking Details of I2C Interface
      16. 6.3.16 DAC Output
      17. 6.3.17 DAC Gain for DAC Output
        1. 6.3.17.1 Connecting DAC Output to DAC GAIN Input
      18. 6.3.18 Memory
        1. 6.3.18.1 EEPROM Memory
          1. 6.3.18.1.1 EEPROM Cache
          2. 6.3.18.1.2 EEPROM Programming Procedure
          3. 6.3.18.1.3 EEPROM Programming Current
          4. 6.3.18.1.4 CRC
      19. 6.3.19 Diagnostics
        1. 6.3.19.1 Power Supply Diagnostics
        2. 6.3.19.2 Sensor Connectivity/Gain Input Faults
        3. 6.3.19.3 Gain Output Diagnostics
        4. 6.3.19.4 PGA302 Harness Open Wire Diagnostics
        5. 6.3.19.5 EEPROM CRC and TRIM Error
      20. 6.3.20 Digital Compensation and Filter
        1. 6.3.20.1 Digital Gain and Offset
        2. 6.3.20.2 TC and NL Correction
        3. 6.3.20.3 Clamping
        4. 6.3.20.4 Filter
      21. 6.3.21 Revision ID
    4. 6.4 Device Functional Modes
  8. Register Maps
    1. 7.1 Programmer's Model
      1. 7.1.1 Memory Map
      2. 7.1.2 Control and Status Registers
        1. 7.1.2.1  MICRO_INTERFACE_CONTROL (DI Page Address = 0x0) (DI Page Offset = 0x0C)
        2. 7.1.2.2  PSMON1 (M0 Address= 0x40000558) (DI Page Address = 0x2) (DI Page Offset = 0x58)
        3. 7.1.2.3  AFEDIAG (M0 Address= 0x4000055A) (DI Page Address = 0x2) (DI Page Offset = 0x5A)
        4. 7.1.2.4  P_GAIN_SELECT (DI Page Address = 0x2) (DI Page Offset = 0x47)
        5. 7.1.2.5  T_GAIN_SELECT (DI Page Address = 0x2) (DI Page Offset = 0x48)
        6. 7.1.2.6  TEMP_CTRL (DI Page Address = 0x2) (DI Page Offset = 0x4C)
        7. 7.1.2.7  OFFSET_CANCEL (DI Page Address = 0x2) (DI Page Offset = 0x4E)
        8. 7.1.2.8  PADC_DATA1 (DI Page Address = 0x0) (DI Page Offset = 0x10)
        9. 7.1.2.9  PADC_DATA2 (DI Page Address = 0x0) (DI Page Offset = 0x11)
        10. 7.1.2.10 TADC_DATA1 (DI Page Address = 0x0) (DI Page Offset = 0x14)
        11. 7.1.2.11 TADC_DATA2 (DI Page Address = 0x0) (DI Page Offset = 0x15)
        12. 7.1.2.12 DAC_REG0_1 (DI Page Address = 0x2) (DI Page Offset = 0x30)
        13. 7.1.2.13 DAC_REG0_2 (DI Page Address = 0x2) (DI Page Offset = 0x31)
        14. 7.1.2.14 OP_STAGE_CTRL (DI Page Address = 0x2) (DI Page Offset = 0x3B)
        15. 7.1.2.15 EEPROM_ARRAY (DI Page Address = 0x5) (DI Page Offset = 0x00 - 0x7F)
        16. 7.1.2.16 EEPROM_CACHE_BYTE0 (DI Page Address = 0x5) (DI Page Offset = 0x80)
        17. 7.1.2.17 EEPROM_CACHE_BYTE1 (DI Page Address = 0x5) (DI Page Offset = 0x81)
        18. 7.1.2.18 EEPROM_PAGE_ADDRESS (DI Page Address = 0x5) (DI Page Offset = 0x82)
        19. 7.1.2.19 EEPROM_CTRL (DI Page Address = 0x5) (DI Page Offset = 0x83)
        20. 7.1.2.20 EEPROM_CRC (DI Page Address = 0x5) (DI Page Offset = 0x84)
        21. 7.1.2.21 EEPROM_STATUS (DI Page Address = 0x5) (DI Page Offset = 0x85)
        22. 7.1.2.22 EEPROM_CRC_STATUS (DI Page Address = 0x5) (DI Page Offset = 0x86)
        23. 7.1.2.23 EEPROM_CRC_VALUE (DI Page Address = 0x5) (DI Page Offset = 0x87)
        24. 7.1.2.24 H0 (EEPROM Address= 0x40000000)
        25. 7.1.2.25 H1 (EEPROM Address= 0x40000002)
        26. 7.1.2.26 H2 (EEPROM Address= 0x40000004)
        27. 7.1.2.27 H3 (EEPROM Address= 0x40000006)
        28. 7.1.2.28 G0 (EEPROM Address= 0x40000008)
        29. 7.1.2.29 G1 (EEPROM Address= 0x4000000A)
        30. 7.1.2.30 G2 (EEPROM Address= 0x4000000C)
        31. 7.1.2.31 G3 (EEPROM Address= 0x4000000E)
        32. 7.1.2.32 N0 (EEPROM Address= 0x40000010)
        33. 7.1.2.33 N1 (EEPROM Address= 0x40000012)
        34. 7.1.2.34 N2 (EEPROM Address= 0x40000014)
        35. 7.1.2.35 N3 (EEPROM Address= 0x40000016)
        36. 7.1.2.36 M0 (EEPROM Address= 0x40000018)
        37. 7.1.2.37 M1 (EEPROM Address= 0x4000001A)
        38. 7.1.2.38 M2 (EEPROM Address= 0x4000001C)
        39. 7.1.2.39 M3 (EEPROM Address= 0x4000001E)
        40. 7.1.2.40 PADC_GAIN (EEPROM Address= 0x40000020)
        41. 7.1.2.41 TADC_GAIN (EEPROM Address= 0x40000021)
        42. 7.1.2.42 PADC_OFFSET (EEPROM Address= 0x40000022)
        43. 7.1.2.43 TADC_OFFSET (EEPROM Address= 0x40000024)
        44. 7.1.2.44 TEMP_SW_CTRL (EEPROM Address= 0x40000028)
        45. 7.1.2.45 DAC_FAULT_MSB (EEPROM Address= 0x4000002A)
        46. 7.1.2.46 LPF_A0_MSB (EEPROM Address= 0x4000002B)
        47. 7.1.2.47 LPF_A1 (EEPROM Address= 0x4000002C)
        48. 7.1.2.48 LPF_A2 (EEPROM Address= 0x4000002E)
        49. 7.1.2.49 .LPF_B1 (EEPROM Address= 0x40000030)
        50. 7.1.2.50 NORMAL_LOW (EEPROM Address= 0x40000032)
        51. 7.1.2.51 NORMAL_HIGH (EEPROM Address= 0x40000034)
        52. 7.1.2.52 LOW_CLAMP (EEPROM Address= 0x40000036)
        53. 7.1.2.53 HIGH_CLAMP (EEPROM Address= 0x40000038)
        54. 7.1.2.54 DIAG_BIT_EN (EEPROM Address= 0x4000003A)
  9. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 0-5V Voltage Output
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Application Data
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. Device and Documentation Support
    1. 9.1 Receiving Notification of Documentation Updates
    2. 9.2 Support Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Application Data

Following is application data measured from a PGA302EVM-037 board. The PGA302 device has been used and was calibrated with three pressure points at one temperature (3P1T) using a resistive bridge emulator board with a schematic as pictured in Figure 8-3.

PGA302 Resistive Bridge Emulator SchematicFigure 8-3 Resistive Bridge Emulator Schematic

For setup, the only parameter changed was to increase the PGAIN of the PGA302 device to 40 V/V. After the calibration was performed, the resulting VOUT output voltages were measured at each of the three pressure points and error was calculated based on the expected values as shown in Table 8-3. Error was calculated using the formula ((VOUT measured – VOUT Expected)/VOUT range) × 100 to account for the expected output range.

Table 8-3 3P1T Calibration Accuracy
CALIBRATION POINTVDD (V)VINPP - VINPN (mV)VOUT MEASURED (V)VOUT EXPECTED (V)ERROR (%FSR)
P14.864234.6510.5030.50.075
P24.860213.8442.5012.50.025
P34.85891.6084.4984.5–0.05%

Additional testing was also done with varying calibration points of 3P3T and 4P4T to show accuracy data across temperature. Table 8-4 includes 3P3T and 4P4T data at the P2 (2.5-V VOUT) pressure point only. The experimental setup is identical to that used to produce the 3P1T data shown in Table 8-3 with the exception of the resistive bridge emulator which includes an extra pressure point for four possible calibration points.

Table 8-4 3P3T and 4P4T Calibration Accuracy
CALIBRATION METHODVOUT VOLTAGEERROR, %FSR
–40°C50°C150°C–40°C50°C150°C
3P3T2.4942.5032.5020.01250.26250.2875
4P4T2.4952.5012.5020.03750.23750.3125