SLLSF09F December   2017  – August 2026 ISO1042

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Transient Immunity
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Thermal Information
    6. 5.6  Power Ratings
    7. 5.7  Insulation Specifications
    8. 5.8  Safety-Related Certifications
    9. 5.9  Safety Limiting Values
    10. 5.10 Electrical Characteristics - DC Specification
    11. 5.11 Switching Characteristics
    12. 5.12 Insulation Characteristics Curves
    13. 5.13 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1 Test Circuits
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 CAN Bus States
      2. 7.3.2 Digital Inputs and Outputs: TXD (Input) and RXD (Output)
      3. 7.3.3 Protection Features
        1. 7.3.3.1 TXD Dominant Timeout (DTO)
        2. 7.3.3.2 Thermal Shutdown (TSD)
        3. 7.3.3.3 Undervoltage Lockout and Default State
        4. 7.3.3.4 Floating Pins
        5. 7.3.3.5 Unpowered Device
        6. 7.3.3.6 CAN Bus Short Circuit Current Limiting
    4. 7.4 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Bus Loading, Length and Number of Nodes
        2. 8.2.2.2 CAN Termination
      3. 8.2.3 Application Curve
        1. 8.2.3.1 Insulation Lifetime
    3. 8.3 DeviceNet Application
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
        1. 8.5.1.1 PCB Material
      2. 8.5.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

8.2.3.1 Insulation Lifetime

Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown (TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal device and high voltage applied between the two sides; See Figure 8-6 for TDDB test setup. The insulation breakdown data is collected at various high voltages switching at 60Hz over temperature. For reinforced insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million (ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolation voltage, VDE reinforced certification requires additional safety margin of 20% for working voltage and 50% for lifetime which translates into minimum required insulation lifetime of 30 years at a working voltage that is 20% higher than the specified value.

Figure 8-7 shows the intrinsic capability of the isolation barrier to withstand high voltage stress over the lifetime of the barrier. Based on the TDDB data, the intrinsic capability of the insulation is 1060VRMS with a lifetime of 275 years. Other factors, such as package size, pollution degree, material group, and so forth, can further limit the working voltage of the component. The working voltage of DW-16 is specified up to 1060VRMS. At the lower working voltages, the corresponding insulation lifetime is much longer than 275 years.

ISO1042 Test Setup for Insulation Lifetime MeasurementFigure 8-6 Test Setup for Insulation Lifetime Measurement
ISO1042 Insulation Lifetime Projection DataFigure 8-7 Insulation Lifetime Projection Data