SLLSFY7 November 2025 ISOW6441 , ISOW6442
ADVANCE INFORMATION
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| Channel Isolation | ||||||
| VITH | Input pin rising threshold | 0.7 × VSI | V | |||
| VITL | Input pin falling threshold | 0.3 × VSI | V | |||
| VI(HYS) | Input pin threshold hysteresis (INx) | 0.1 × VSI | V | |||
| IIL | Low level input current | VIL = 0 at INx | -25 | µA | ||
| IIH | High level input current | VIH = VSI(1) at INx | 25 | µA | ||
| VOH | High level output voltage | IO = –2 mA, see Switching Characteristics Test Circuit and Voltage Waveforms | VSO(1) – 0.3 | V | ||
| VOL | Low level output voltage | IO = 2 mA, see Switching Characteristics Test Circuit and Voltage Waveforms | 0.3 | V | ||
| CMTI | Common mode transient immunity | VI = VSI or 0 V, VCM = 1000 V; see Common-Mode Transient Immunity Test Circuit | 100 | 200 | kV/µs | |
| Ci | Input Capacitance | VI = VDDL/ 2 + 0.4×sin(2πft), f = 2MHz, VDDL = 2.5V | 2 | pF | ||