SLVSHS0A March 2025 – October 2025 TPS482H85-Q1
PRODUCTION DATA
When switching an inductive load off, the inductive reactance tends to pull the output voltage negative. Excessive negative voltage could cause the power FET to break down. To protect the power FET, an internal clamp between drain and source is implemented, namely VDS(clamp).

During the period of demagnetization (tdecay), the power FET is turned on for inductance-energy dissipation. The total energy is dissipated in the high-side switch. Total energy includes the energy of the power supply (E(VS)) and the energy of the load (E(load)). If resistance is in series with inductance, some of the load energy is dissipated on the resistance.

When an inductive load switches off, E(HSS) causes high thermal stressing on the device. The upper limit of the power dissipation depends on the device intrinsic capacity, ambient temperature, and board dissipation condition.
Figure 7-7 Drain-to-Source Clamping Structure
Figure 7-8 Inductive Load Switching-Off DiagramFrom the perspective of the high-side switch, E(HSS) equals the integration value during the demagnetization period.

When R approximately equals 0, E(HSD) can be given simply as:

The device optimizes the switching-off slew rate when the clamp is active. This optimization can help the system design by keeping the effects of transient power and EMI to a minimum. The controlled slew rate is around 0.7V/µs.
The recommendation for PWM-controlled inductive loads is to add the external freewheeling circuitry shown in Figure 7-9 to protect the device from repetitive power stressing. The TVS is used to achieve the fast decay. See Figure 7-9 for more details.