STDA039 July   2026 F28377D-SEP , INA901-SP , SN54SLC8T245-SEP , TPS7A4501-SP , TPS7H1121-SEP , TPS7H1121-SP , TPS7H5020-SEP , TPS7H5020-SP , TPS7H6101-SEP

 

  1.   1
  2.   Abstract
  3. 1Introduction
  4. 2Space ‑ Electronics Design Landscape
  5. 3Importance of a Single Controlled Baseline
  6. 4The Steps to Take to Upscreen a COTS Device
    1. 4.1 Step 1 – Identifying the Candidates
    2. 4.2 Step 2 – Preparation for Single‑Event Effect (SEE) Testing (Opening)
    3. 4.3 Step 3 – Single‑Event Effect (SEE) Testing
    4. 4.4 Step 4 – Running TID Tests and Evaluating Radiation Lifetime
  7. 5Lead‑Time and Yield Responsibility
  8. 6Summary
  9. 7References

7 References

  1. Deming, W. E. (2018). Out of the crisis (Kindle ed.). The MIT Press. (Original work published 1982).
  2. Kruckmeyer, Kirby, (2022). Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products application note, Texas Instruments.
  3. Kuechen, Frederik and Seidl, Michael (2025). IC Sourcing for Space: How to Cut Costs Without Cutting Corners ON24 Webinar.
  4. Staerk, Daniela Dr. (2000). Chief Engineer at TESAT for EEE matters and related technologies, referencing to W. Edwards Deming. Out of the Crisis – 2nd Edition, Kindle Edition. The MIT Press.
  5. Texas Instruments, (2019). Radiation Handbook for Electronics, e-book (access through TI myTI™ on-line information services account ID).
  6. State University New York at Buffalo, (2019). Figure 1: Matte-tin-plated-IC-02 photograph, Photo courtesy of Peter Bush, NASA Basic Info/FAQ webpage.