STDA039 July   2026 F28377D-SEP , INA901-SP , SN54SLC8T245-SEP , TPS7A4501-SP , TPS7H1121-SEP , TPS7H1121-SP , TPS7H5020-SEP , TPS7H5020-SP , TPS7H6101-SEP

 

  1.   1
  2.   Abstract
  3. 1Introduction
  4. 2Space ‑ Electronics Design Landscape
  5. 3Importance of a Single Controlled Baseline
  6. 4The Steps to Take to Upscreen a COTS Device
    1. 4.1 Step 1 – Identifying the Candidates
    2. 4.2 Step 2 – Preparation for Single‑Event Effect (SEE) Testing (Opening)
    3. 4.3 Step 3 – Single‑Event Effect (SEE) Testing
    4. 4.4 Step 4 – Running TID Tests and Evaluating Radiation Lifetime
  7. 5Lead‑Time and Yield Responsibility
  8. 6Summary
  9. 7References

Step 4 – Running TID Tests and Evaluating Radiation Lifetime

The next step is to assess the effect of the total ionizing dose (TID) that the device is expected to accumulate while in orbit. TESAT’s customers typically require a minimum tolerance of 15krad to 30krad, and these customers also want to know the dose at which the critical device parameters fail completely.

As a general rule, roughly another 25% of the candidates do not pass this test.

Overall, as summarized in Table 4-2, TESAT estimates a success probability of about 40% for non power, lower complexity devices, but often with notable derating requirements.

Table 4-2 Typical Success Rate for Non‑Power, Lower‑Complexity ICs Observed by TESAT
Typical Success Rate from Experience – 5 Candidates IC
Step Typical Success Rate Remaining Candidates
Technology evaluation 90% 4
Opening 90% 4
SEE 75% 3
TID 75% 2
Other (T&C, commercial, and so forth) 95% 2
Total 43% 2 out of 5

Successful execution of these test campaigns requires a robust allocation of both capital and time. Decision-makers must anticipate a project timeline of approximately 20 weeks. Total investment levels fluctuate based on the availability of specialized test equipment, custom adapters, and necessary tooling. To mitigate these costs and accelerate throughput, leveraging automated testing stations—such as those implemented in TESAT—is highly recommended. These systems enable parallel component testing, providing significant scalability and efficiency advantages during large-scale up-screening phases. The break‑even point of an up-screening compared to purchasing space‑grade parts with high unit prices is roughly at 1,000 units. In the space market this constitutes a relatively high volume, so both, TESAT and TI advise negotiating pricing with the vendor before launching a screening campaign. This is especially true for space infrastructure programs like constellations, with quantities of identical satellites, since the space industry strives for series production approaches and is in the range to reach the above component numbers.

For space equipment manufacturers with interest in more details on component up-screening or services for EEE (electrical, electronic and electromechanical) parts, visit the TESAT Parts Agency website.

The TESAT CAMPUS on-site training offers further insights, conducted by TESAT senior engineering and EEE experts.

TPS7H6101-SEP F28377D-SEP INA901-SP TPM9R00-SP TPS7H5020-SEP TPS7H5020-SP TPS7H1121-SP TPS7A4501-SP SN54SLC8T More Details and Insights on
                    Component Up-Screening or Services for EEE (Electrical, Electronic and
                    Electromechanical) Parts Can be Found on the TESAT Webpage Figure 4-3 More Details and Insights on Component Up-Screening or Services for EEE (Electrical, Electronic and Electromechanical) Parts Can be Found on the TESAT Webpage