Radiation hardened RS-422 dual differential drivers and receivers in space Enhanced Plastic
Product details
Parameters
Package | Pins | Size
Features
- VID V62/19606
- Radiation hardened
- Single event latch-up (SEL) immune to 43 MeV-cm2/mg at 125°C
- ELDRS-free to 30 krad(Si)
- Total ionizing dose (TID) RLAT for every wafer lot up to 20 krad(Si)
- Space Enhanced Plastic
- Controlled baseline
- Gold wire
- NiPdAu lead finish
- One assembly and test site
- One fabrication site
- Available in military (–55°C to 125°C) temperature range
- Extended product life cycle
- Extended product-change notification
- Product traceability
- Enhanced mold compound for low outgassing
- Meet or exceed standards TIA/EIA-422-B and ITU recommendation V.11
- Operate from single 5-V power supply
- ESD protection for RS-422 bus pins
- ±12-kV human-body model (HBM)
- ±8-kV IEC 61000-4-2, contact discharge
- ±8-kV IEC 61000-4-2, air-gap discharge
- Low-pulse skew
- Receiver input impedance . . . 17 kΩ (typical)
- Receiver input sensitivity . . . ±200 mV
- Receiver common-mode input voltage range of
–7 V to 7 V - Glitch-free power-up/power-down protection
All trademarks are the property of their respective owners.
Description
The SN65C1168E-SEP consists of dual drivers and dual receivers with ±12-kV ESD (HBM) and ±8-kV ESD (IEC61000-4-2 Air-Gap Discharge and Contact Discharge) for RS-422 bus pins. The device meets the requirements of TIA/EIA-422-B and ITU recommendation V.11. Some parameters do not meet all TIA/EIA-422-B and ITU recommendation V.11 requirements after 20-krad(Si) TID exposure.
The SN65C1168E-SEP drivers have individual active-high enables.
Technical documentation
Type | Title | Date | |
---|---|---|---|
* | Datasheet | SN65C1168E-SEP Dual Differential Drivers and Receivers With ±12-kV ESD Protection datasheet | Jul. 23, 2019 |
* | Radiation & reliability report | SN65C1168E-SEP Single-Event Latch-Up (SEL) Radiation Report | Oct. 30, 2020 |
* | VID | SN65C1168E-SEP VID V6219606 | Aug. 06, 2020 |
* | Radiation & reliability report | SN65C1168E-SEP Reliability Report | Jun. 24, 2019 |
* | Radiation & reliability report | SN65C1168E-SEP Total Ionizing Dose (TID) Radiation Report | Apr. 02, 2019 |
Selection guide | TI Space Products (Rev. H) | Jan. 27, 2021 | |
Technical article | Space Enhanced Plastic gives designers a new solution for emerging low-Earth orbit commercial applications | Oct. 03, 2019 | |
Application note | Reduce the risk in NewSpace with Space Enhanced Plastic products | Jul. 29, 2019 |
Design & development
For additional terms or required resources, click any title below to view the detail page where available.Hardware development
Description
Features
- Board design allows for versatility in evaluation
- Supports a wide-range of logic devices
Design tools & simulation
Features
- Leverages Cadence PSpice Technology
- Preinstalled library with a suite of digital models to enable worst-case timing analysis
- Dynamic updates ensure you have access to most current device models
- Optimized for simulation speed without loss of accuracy
- Supports simultaneous analysis of multiple products
- (...)
CAD/CAE symbols
Package | Pins | Download |
---|---|---|
TSSOP (PW) | 16 | View options |
Ordering & quality
- RoHS
- REACH
- Device marking
- Lead finish/Ball material
- MSL rating/Peak reflow
- MTBF/FIT estimates
- Material content
- Qualification summary
- Ongoing reliability monitoring
Recommended products may have parameters, evaluation modules or reference designs related to this TI product.
Support & training
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