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SN54SC6T17-SEP

Name: SN54SC6T17-SEP
Brand: TI
SKU: SN54SC6T17-SEP
Price: 150 USD

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Radiation-tolerant six-bit fixed-direction level translator with Schmitt-trigger inputs

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Datenblatt

document-pdfAcrobat SN54SC6T17-SEP Radiation Tolerant, Hex Schmitt-Trigger Buffer with Integrated Translation datasheet (Englisch) PDF | HTML

SN54SC6T17-SEP

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Datenblatt

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Produktdetails

Technology family

SCxT

Vout (min) (V)

1.2

Vout (max) (V)

5.5

Features

Balanced outputs, Over-voltage tolerant inputs

Input type

TTL-Compatible CMOS

Output type

Push-Pull

Rating

Space

Operating temperature range (°C)

-55 to 125

Technology family

SCxT

Vout (min) (V)

1.2

Vout (max) (V)

5.5

Features

Balanced outputs, Over-voltage tolerant inputs

Input type

TTL-Compatible CMOS

Output type

Push-Pull

Rating

Space

Operating temperature range (°C)

-55 to 125

TSSOP (PW)

14

32 mm² 5 x 6.4

Vendor item drawing available, VID V62/24619
Total ionizing dose characterized at 30 krad (Si)
- Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si)
Single-event effects (SEE) characterized:
- Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg
- Single event transient (SET) characterized to 43 MeV-cm2 /mg
Wide operating range of 1.2V to 5.5V
Single-supply translating gates at 5/3.3/2.5/1.8/1.2V VCC
- TTL compatible inputs:
  - Up translation:
    - 1.8V – Inputs from 1.2V
    - 2.5V – Inputs from 1.8V
    - 3.3V – Inputs from 1.8V, 2.5V
    - 5.0V – Inputs from 2.5V, 3.3V
  - Down translation:
    - 1.2V – Inputs from 1.8V, 2.5V, 3.3V, 5.0V
    - 1.8V – Inputs from 2.5V, 3.3V, 5.0V
    - 2.5V – Inputs from 3.3V, 5.0V
    - 3.3V – Inputs from 5.0V
5.5V tolerant input pins
Output drive up to 25mA AT 5V
Latch-up performance exceeds 250mA per JESD 17
Space enhanced plastic (SEP)
- Controlled baseline
- Gold bondwire
- NiPdAu lead finish
- One assembly and test site
- One fabrication site
- Military (–55°C to 125°C) temperature range
- Extended product life cycle
- Product traceability
- Meets NASAs ASTM E595 outgassing specification

Vendor item drawing available, VID V62/24619
Total ionizing dose characterized at 30 krad (Si)
- Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si)
Single-event effects (SEE) characterized:
- Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg
- Single event transient (SET) characterized to 43 MeV-cm2 /mg
Wide operating range of 1.2V to 5.5V
Single-supply translating gates at 5/3.3/2.5/1.8/1.2V VCC
- TTL compatible inputs:
  - Up translation:
    - 1.8V – Inputs from 1.2V
    - 2.5V – Inputs from 1.8V
    - 3.3V – Inputs from 1.8V, 2.5V
    - 5.0V – Inputs from 2.5V, 3.3V
  - Down translation:
    - 1.2V – Inputs from 1.8V, 2.5V, 3.3V, 5.0V
    - 1.8V – Inputs from 2.5V, 3.3V, 5.0V
    - 2.5V – Inputs from 3.3V, 5.0V
    - 3.3V – Inputs from 5.0V
5.5V tolerant input pins
Output drive up to 25mA AT 5V
Latch-up performance exceeds 250mA per JESD 17
Space enhanced plastic (SEP)
- Controlled baseline
- Gold bondwire
- NiPdAu lead finish
- One assembly and test site
- One fabrication site
- Military (–55°C to 125°C) temperature range
- Extended product life cycle
- Product traceability
- Meets NASAs ASTM E595 outgassing specification

The SN54SC6T17-SEP device contains six independent Buffers with Schmitt-trigger inputs. Each gate performs the Boolean function Y = A in positive logic. The output level is referenced to the supply voltage (VCC) and supports 1.8V, 2.5V, 3.3V, and 5V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example 1.2V input to 1.8V output or 1.8V input to 3.3V output). Additionally, the 5V tolerant input pins enable down translation (for example 3.3V to 2.5V output).

The SN54SC6T17-SEP device contains six independent Buffers with Schmitt-trigger inputs. Each gate performs the Boolean function Y = A in positive logic. The output level is referenced to the supply voltage (VCC) and supports 1.8V, 2.5V, 3.3V, and 5V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example 1.2V input to 1.8V output or 1.8V input to 3.3V output). Additionally, the 5V tolerant input pins enable down translation (for example 3.3V to 2.5V output).

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Alle anzeigen 5

	Typ	Titel		Datum
*	Data sheet	SN54SC6T17-SEP Radiation Tolerant, Hex Schmitt-Trigger Buffer with Integrated Translation datasheet	PDF \| HTML	22 Jan 2024
*	Radiation & reliability report	SN54SC6T17-SEP Production Flow and Reliability Report	PDF \| HTML	11 Apr 2024
*	Radiation & reliability report	SN54SC6T07-SEP Single Event Effects Radiation Report	PDF \| HTML	21 Feb 2024
*	Radiation & reliability report	SN54SC6T17-SEP Total Ionizing Dose (TID) Radiation Report	PDF \| HTML	13 Feb 2024
	Application note	Understanding Transient Drive Strength vs. DC Drive Strength in CMOS Output Buffers	PDF \| HTML	14 Mai 2024

Design und Entwicklung

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TSSOP (PW)	14	Optionen anzeigen

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SN54SC6T17-SEP

Radiation-tolerant six-bit fixed-direction level translator with Schmitt-trigger inputs

SN54SC6T17-SEP

Produktdetails

Technische Dokumentation

Design und Entwicklung

14-24-LOGIC-EVM — Generisches Logikprodukt-Evaluierungsmodul für 14-polige bis 24-polige D-, DB-, DGV-, DW-, DYY-, NS-

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