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SN74AC08-EP

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Highspeed-UND-Gatter (7 ns) mit 24-mA-Treiberstärke, 4 Kanäle, 2 Eingänge, 2 V bis 6 V (Verbessertes

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Datenblatt

SN74AC08-EP

OBSOLET
Datenblatt Jetzt bestellen

Produktdetails

Technology family AC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family AC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOIC (D) 14 51.9 mm² (8.65 mm × 6 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of −55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree†
  • 2-V to 6-V V CC Operation
  • Inputs Accept Voltages to 6 V
  • Max t pd of 7.5 ns at 5 V

(1)† Component qualification in accordance with JEDEC and industry standards to provide reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of −55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree†
  • 2-V to 6-V V CC Operation
  • Inputs Accept Voltages to 6 V
  • Max t pd of 7.5 ns at 5 V

(1)† Component qualification in accordance with JEDEC and industry standards to provide reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74AC08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = A + B in positive logic.

The SN74AC08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = A + B in positive logic.
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Top-Dokumentation Typ Titel Format-Optionen Neueste englische Version herunterladen Datum
* Datenblatt SN74AC08-EP Quadruple 2-Input Positive-and Gate datasheet (Rev. A) PDF | HTML 28.06.2023
* Strahlungs- und Zuverlässigkeitsbericht SN74AC08MDREP Reliability Report 04.06.2012
* VID SN74AC08-EP VID V6204615 21.06.2016

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