SN74AHC1G04

Flexibles EVM zur Unterstützung aller Geräte mit 5- bis 8-poligem DCK-, DCT-, DCU-, DRL- oder DBV-Gehäuse.

This reference design for high performance data acquisition (DAQ) systems optimizes power stage in order to reduce power consumption and minimize the effect of EMI from switching regulator by using LMS3635-Q1 buck converter.  This reference designs yields 7.2% efficiency improvement at most (...)

The TIDA-01054 reference design helps eliminate the performance degrading effects of EMI on Data Acquisition (DAQ) systems greater than 16 bits with the help of the LM53635 buck converter. The buck converter enables the designer to place power solutions close to the signal path without the (...)

This isolated, 3.65-mm thin reference design enables highly-integrated, bipolar input and high-performance solutions with a 24-bit delta-sigma analog-to-digital converter (ADC). Modern analog input modules need high performance in different aspects such as higher channel density at the same room (...)

The TIDA-01055 reference design for high performance DAQ Systems optimizes the ADC reference buffer to improve SNR performance and reduce power consumption with the TI OPA837 high-speed op amp. This device is used in a composite buffer configuration and provides a 22% power improvement over (...)

This reference design is designed for high performance data acquisition(DAQ) systems to improve the dynamic range of 20 bit differential input ADCs. Many DAQ systems require the measurement capability at a wide FSR (Full Scale Range) in order to obtain sufficient signal dynamic range. Many earlier (...)

TIDA-01037 is a 20-bit, 1 MSPS isolated analog input data acquisition reference design that utilizes two different isolator devices to maximize signal chain SNR and sample rate performance. For signals requiring low jitter, such as ADC sampling clocks, TI’s ISO73xx family of low jitter (...)

The TIDA-01051 reference design is used to demonstrate optimized channel density, integration, power consumption, clock distribution and signal chain performance of very high channel count data acquisition (DAQ) systems such as those used in automatic test equipment (ATE). Using serializers, such (...)

The TIDA-01050 reference design aims to improve the integration, power consumption, performance, and clocking issues typically associated with automatic test equipment. This design is applicable to any ATE system but most applicable to systems requiring a large number of input channels.

The TIDA-01052 reference design aims to highlight system performance increases seen using a negative voltage rail on the analog front end driver amplifiers rather than ground. This concept is relative to all analog front ends, however this design is aimed specifically at automatic test equipment.