Inicio Interfaz Circuitos integrados LVDS, M-LVDS y PECL
Inicio
Interfaz
Circuitos integrados LVDS, M-LVDS y PECL

SN55LVTA4-SEP

ACTIVO

Radiation-tolerant, Quad-channel high-speed differential line driver

Haga su pedido ahora
Hoja de datos

SN55LVTA4-SEP

ACTIVO
Hoja de datos Haga su pedido ahora

Detalles del producto

Function Driver Protocols LVDS Number of transmitters 4 Number of receivers 0 Signaling rate (Mbps) 400 Input signal LVTTL Output signal LVDS Rating Space Operating temperature range (°C) -55 to 125
Function Driver Protocols LVDS Number of transmitters 4 Number of receivers 0 Signaling rate (Mbps) 400 Input signal LVTTL Output signal LVDS Rating Space Operating temperature range (°C) -55 to 125
SOIC (D) 16 59.4 mm² (9.9 mm × 6 mm)
  • VID V62/25605-01XE
  • Total ionizing dose characterized at 30krad (Si)
    • Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 50MeV-cm2 /mg
    • Single event transient (SET) characterized to 50MeV-cm2/mg.
  • Meet or exceed the requirements of ANSI TIA/EIA-644 standard
  • Low-voltage differential signaling with typical output voltage of 350mV and 100Ω load
  • Typical output voltage rise and fall times of 500ps (400Mbps)
  • Typical propagation delay times of 1.7ns
  • Operate from a single 3.3V supply
  • Power dissipation 25mW typical per driver at 200MHz
  • Driver at high impedance when disabled or with VCC = 0
  • Bus-terminal ESD protection exceeds 8kV
  • Low-voltage TTL (LVTTL) logic input levels
  • Cold sparing for space and high reliability applications requiring redundancy
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold wire, NiPdAu lead finish
    • One assembly and test site, one fabrication site
    • Extended product life cycle
    • Military (–55°C to 125°C) temperature range
    • Product traceability
    • Meets NASA ASTM E595 outgassing specification
  • VID V62/25605-01XE
  • Total ionizing dose characterized at 30krad (Si)
    • Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 50MeV-cm2 /mg
    • Single event transient (SET) characterized to 50MeV-cm2/mg.
  • Meet or exceed the requirements of ANSI TIA/EIA-644 standard
  • Low-voltage differential signaling with typical output voltage of 350mV and 100Ω load
  • Typical output voltage rise and fall times of 500ps (400Mbps)
  • Typical propagation delay times of 1.7ns
  • Operate from a single 3.3V supply
  • Power dissipation 25mW typical per driver at 200MHz
  • Driver at high impedance when disabled or with VCC = 0
  • Bus-terminal ESD protection exceeds 8kV
  • Low-voltage TTL (LVTTL) logic input levels
  • Cold sparing for space and high reliability applications requiring redundancy
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold wire, NiPdAu lead finish
    • One assembly and test site, one fabrication site
    • Extended product life cycle
    • Military (–55°C to 125°C) temperature range
    • Product traceability
    • Meets NASA ASTM E595 outgassing specification

The SN55LVTA4-SEP is a differential line driver that implements the electrical characteristics of low-voltage differential signaling (LVDS) with a 3.3V supply. This driver delivers a minimum differential output voltage magnitude of 247mV into a 100Ω load when enabled.

The intended application of this device and signaling technique is both point-to-point and multi-drop (one driver and multiple receivers) data transmission over controlled impedance media of approximately 100Ω. The transmission media can be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN55LVTA4-SEP is characterized for operation from –55°C to 125°C.

The SN55LVTA4-SEP is a differential line driver that implements the electrical characteristics of low-voltage differential signaling (LVDS) with a 3.3V supply. This driver delivers a minimum differential output voltage magnitude of 247mV into a 100Ω load when enabled.

The intended application of this device and signaling technique is both point-to-point and multi-drop (one driver and multiple receivers) data transmission over controlled impedance media of approximately 100Ω. The transmission media can be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN55LVTA4-SEP is characterized for operation from –55°C to 125°C.
filter Buscar otro/a Circuitos integrados LVDS, M-LVDS y PECL
Descargar Ver vídeo con transcripción Video

Productos similares que pueden interesarle

open-in-new Comparar alternativas
Funcionalidad similar a la del dispositivo comparado
NUEVO SN55LVRA4-SEP ACTIVO Receptor diferencial de alta velocidad y cuatro canales tolerante a la radiación Line Receiver version

Documentación técnica

No se encontraron resultados. Borre su búsqueda y vuelva a intentarlo.
Ver todo 6
Documentación principal Tipo Título Opciones de formato Descargar la versión más reciente en inglés Fecha
* Hoja de datos SN55LVTA4-SEP Radiation Tolerant Quad Channel High-Speed Differential Line Driver datasheet (Rev. A) PDF | HTML 30/06/2025
* Informe de radiación y confiabilidad SN55LVTA4-SEP Single-Event Effects (SEE) Radiation Report PDF | HTML 23/06/2025
* Informe de radiación y confiabilidad SN55LVTA4-SEP Total Ionizing Dose (TID) Report PDF | HTML 23/06/2025
* Informe de radiación y confiabilidad SN55LVTA4-SEP Production Flow and Reliability Report PDF | HTML 3/06/2025
* VID SN55LVTA4-SEP VID SN55LVTA4-SEP VID V62/25605 5/05/2026
Guía de selección TI Space Products (Rev. L) 27/03/2026

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

SN65LVDS31-33EVM — Módulo de evaluación para SN65LVDS31 y SN65LVDS33

TI offers a series of low-voltage differential signaling (LVDS) evaluation modules (EVMs) designed for analysis of the electrical characteristics of LVDS drivers and receivers. Four unique EVMs are available to evaluate the different classes of LVDS devices offered by TI.

As seen in the Combination (...)

Productos y hardware compatibles
En inventario
Límite:
??asset.out-of-stock-ti_es_MX??
No disponible
Modelo de simulación

SN65LVDS31 IBIS Model (Rev. B)

SLLC012A (29 KB) - Modelo IBIS
Productos y hardware compatibles
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
SOIC (D) 16 Ultra Librarian
Se aplican los Términos y condiciones estándar de TI para los elementos de evaluación.

Pedidos y calidad

Los productos recomendados pueden tener parámetros, módulos de evaluación o diseños de referencia relacionados con este producto de TI.

Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI

Ver todos los temas del foro en inglés

El contenido lo proporcionan “tal como está” TI y los colaboradores de la comunidad y no constituye especificaciones de TI. Consulte los términos de uso.

Si tiene alguna pregunta sobre calidad, encapsulados o pedido de productos de TI, consulte el servicio de asistencia de TI. ​​​​​​​​​​​​​​

Videos