TPS61162
Controlador WLED de doble canal para teléfonos inteligentes
TPS61162
- 2.7-V to 6.5-V Input Voltage
- Integrated 1.5-A/40-V MOSFET
- 1.2-MHz Switching Frequency
- Dual Current Sinks of up to 30-mA Current Each
- 1% Typical Current Matching and Accuracy
- 26.5-V Overvoltage Protection Threshold
- Adaptive Boost Output to WLED Voltages
- Very Low Voltage Headroom Control (90 mV)
- Flexible Digital and PWM Brightness Control
- One-Wire Control Interface (EasyScale)
- PWM Dimming Control Interface
- Up to 100:1 PWM Dimming Ratio
- Up to 10-Bit Dimming Resolution
- Up to 90% Efficiency
- Built-in Soft Start
- Built-in WLED Open and Short Protection
- Thermal Shutdown
- Supports 4.7-µH Inductor Application
The TPS61162D is a dual-channel WLED driver which provides highly integrated solutions for single-cell Li-ion-battery-powered smart-phone backlighting. The device has a built-in high efficiency boost regulator with integrated 1.5-A/40-V power MOSFET and can support as low as 2.7-V input voltage. With two high current-matching capability current sink regulators, the device can drive up to 7s2p WLED diodes. The boost output can automatically adjust to the WLED forward voltage, allowing very low voltage headroom control, thus improving LED strings efficiency effectively.
The TPS61162D supports both the PWM dimming interface and one-wire digital EasyScale dimming interface and can realize 9-bit brightness code programming.
The TPS61162D integrates built-in soft start, overvoltage, and overcurrent protection, as well as thermal shutdown protections.
For all available packages, see the orderable addendum at the end of the data sheet.Documentación técnica
| Tipo | Título | Fecha | ||
|---|---|---|---|---|
| * | Data sheet | TPS61162D Dual-Channel WLED Drivers for Smart Phones datasheet (Rev. A) | PDF | HTML | 29 mar 2016 |
Pedidos y calidad
- RoHS
- REACH
- Marcado del dispositivo
- Acabado de plomo/material de la bola
- Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
- Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
- Contenido del material
- Resumen de calificaciones
- Monitoreo continuo de confiabilidad
- Lugar de fabricación
- Lugar de ensamblaje