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CD74HCT574-EP

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データシート

CD74HCT574-EP

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データシート ご注文はこちら

製品詳細

Number of channels 8 Technology family HCT Input type TTL-Compatible CMOS Output type 3-State Clock frequency (max) (MHz) 25 IOL (max) (mA) 6 IOH (max) (mA) -6 Supply current (max) (µA) 80 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 125 Rating HiRel Enhanced Product
Number of channels 8 Technology family HCT Input type TTL-Compatible CMOS Output type 3-State Clock frequency (max) (MHz) 25 IOL (max) (mA) 6 IOH (max) (mA) -6 Supply current (max) (µA) 80 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 125 Rating HiRel Enhanced Product
TSSOP (PW) 20 41.6 mm² (6.5 mm × 6.4 mm) SOIC (DW) 20 131.84 mm² (12.8 mm × 10.3 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • Buffered Inputs
  • Common 3-State Output-Enable Control
  • 3-State Outputs
  • Bus-Line Driving Capability
  • Typical Propagation Delay (Clock to Q):
       15 ns at VCC = 5 V, CL = 15 pF, TA = 25°C
  • Fanout (Over Temperature Range)
    • Standard Outputs . . . 10 LSTTL Loads
    • Bus Driver Outputs . . . 15 LSTTL Loads
  • Balanced Propagation Delay and Transition Times
  • Significant Power Reduction Compared to LSTTL Logic ICs
  • VCC Voltage = 4.5 V to 5.5 V
  • Direct LSTTL Input Logic Compatibility, VIL = 0.8 V (Max), VIH = 2 V (Min)
  • CMOS Input Compatibility, Il ≤ 1 µA at VOL, VOH

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • Buffered Inputs
  • Common 3-State Output-Enable Control
  • 3-State Outputs
  • Bus-Line Driving Capability
  • Typical Propagation Delay (Clock to Q):
       15 ns at VCC = 5 V, CL = 15 pF, TA = 25°C
  • Fanout (Over Temperature Range)
    • Standard Outputs . . . 10 LSTTL Loads
    • Bus Driver Outputs . . . 15 LSTTL Loads
  • Balanced Propagation Delay and Transition Times
  • Significant Power Reduction Compared to LSTTL Logic ICs
  • VCC Voltage = 4.5 V to 5.5 V
  • Direct LSTTL Input Logic Compatibility, VIL = 0.8 V (Max), VIH = 2 V (Min)
  • CMOS Input Compatibility, Il ≤ 1 µA at VOL, VOH

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The CD74HCT574 is an octal D-type flip-flop with 3-state outputs and the capability to drive 15 LSTTL loads. The eight edge-triggered flip-flops enter data into their registers on the low-to-high transition of the clock (CP). The output enable (OE)\ controls the 3-state outputs and is independent of the register operation. When OE\ is high, the outputs are in the high-impedance state.

The CD74HCT574 is an octal D-type flip-flop with 3-state outputs and the capability to drive 15 LSTTL loads. The eight edge-triggered flip-flops enter data into their registers on the low-to-high transition of the clock (CP). The output enable (OE)\ controls the 3-state outputs and is independent of the register operation. When OE\ is high, the outputs are in the high-impedance state.
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上位の文書 タイプ タイトル フォーマットオプション 最新の英語版をダウンロード 日付
* データシート CD74HCT574-EP データシート 2004/02/06
* VID CD74HCT574-EP VID V6204739 2016/06/21

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