AFE1256

활성

평면 패널 디지털 엑스레이 감지기용 256채널 아날로그 프론트 엔드(AFE)

제품 상세 정보

Number of input channels 256 Resolution (Bits) 16 Features Internal Reference Buffer, Nap Mode, Power Down, X-ray Interface type SPI Operating temperature range (°C) 0 to 70 Rating Catalog
Number of input channels 256 Resolution (Bits) 16 Features Internal Reference Buffer, Nap Mode, Power Down, X-ray Interface type SPI Operating temperature range (°C) 0 to 70 Rating Catalog
COF (TDS) 314 1064 mm² (— mm × — mm) DIESALE (TD) See data sheet
  • 256 Channels
  • On-Chip, 16-Bit ADC
  • Photodiode Short Immunity
  • Column Short Immunity
  • High Performance:
    • Noise: 758 e-RMS with 28-pF Sensor
      Capacitor in 1.2-pC Range
    • Integral Nonlinearity:
      ±2 LSB with Internal 16-Bit ADC
    • Minimum Scan Time:
      • 37.9 µs in Normal Mode
      • 20 µs in 2x Binning Mode
  • Integration:
    • Eight Selectable Full-Scale Ranges:
      0.15 pC (Min) to 9.6 pC (Max)
    • Built-In Correlated Double Sampler
    • 2x Binning (Averages Charge of Two Adjacent
      Channels) for Faster Throughput
    • Pipelined Integrate and Read: Allows Data
      Read During Integration
  • Flexibility:
    • Electron and Hole Integration
  • Low Power:
    • 2.9 mW/Ch with ADC
    • 2.3 mW/Ch without ADC
    • 0.1 mW/Ch in Nap Mode
    • Total Power-Down Feature
  • 22-mm × 5-mm Gold-Bump Die,
    Suitable for TCP and COF

Application

  • Flat-Panel, X-Ray Detector

All trademarks are the property of their respective owners.

  • 256 Channels
  • On-Chip, 16-Bit ADC
  • Photodiode Short Immunity
  • Column Short Immunity
  • High Performance:
    • Noise: 758 e-RMS with 28-pF Sensor
      Capacitor in 1.2-pC Range
    • Integral Nonlinearity:
      ±2 LSB with Internal 16-Bit ADC
    • Minimum Scan Time:
      • 37.9 µs in Normal Mode
      • 20 µs in 2x Binning Mode
  • Integration:
    • Eight Selectable Full-Scale Ranges:
      0.15 pC (Min) to 9.6 pC (Max)
    • Built-In Correlated Double Sampler
    • 2x Binning (Averages Charge of Two Adjacent
      Channels) for Faster Throughput
    • Pipelined Integrate and Read: Allows Data
      Read During Integration
  • Flexibility:
    • Electron and Hole Integration
  • Low Power:
    • 2.9 mW/Ch with ADC
    • 2.3 mW/Ch without ADC
    • 0.1 mW/Ch in Nap Mode
    • Total Power-Down Feature
  • 22-mm × 5-mm Gold-Bump Die,
    Suitable for TCP and COF

Application

  • Flat-Panel, X-Ray Detector

All trademarks are the property of their respective owners.

The AFE1256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detectors (FPDs) based on digital X-ray systems. The device includes 256 integrators, a programmable gain amplifier (PGA) for full-scale, charge-level selection, a correlated double sampler (CDS) with dual banking, 256:4 analog multiplexers, and four 16-bit, successive-approximation register (SAR) analog-to-digital converters (ADCs) onboard. Serial data from the ADCs are available in SPI™ format.

Hardware-selectable integration polarity allows for the integration of positive or negative charge and provides more flexibility in system design. The Nap feature enables substantial power saving. This power savings is especially useful in battery-powered systems.

The device is available as a 22-mm × 5-mm gold-bumped die and a 38-mm × 28-mm, COF-314 TDS package in singulated forms.

To request a full data sheet or other design resources: request AFE1256

The AFE1256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detectors (FPDs) based on digital X-ray systems. The device includes 256 integrators, a programmable gain amplifier (PGA) for full-scale, charge-level selection, a correlated double sampler (CDS) with dual banking, 256:4 analog multiplexers, and four 16-bit, successive-approximation register (SAR) analog-to-digital converters (ADCs) onboard. Serial data from the ADCs are available in SPI™ format.

Hardware-selectable integration polarity allows for the integration of positive or negative charge and provides more flexibility in system design. The Nap feature enables substantial power saving. This power savings is especially useful in battery-powered systems.

The device is available as a 22-mm × 5-mm gold-bumped die and a 38-mm × 28-mm, COF-314 TDS package in singulated forms.

To request a full data sheet or other design resources: request AFE1256

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추가 정보 요청

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기술 자료

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* 데이터 시트 AFE1256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors datasheet (Rev. D) PDF | HTML 2016. 5. 26
아날로그 디자인 학술지 Selecting a multichannel ultra-low-current measurement IC PDF | HTML 2022. 3. 18

설계 및 개발

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평가 보드

AFE1256EVM — AFE1256 평판 디지털 엑스레이 감지기용 256채널 AFE 평가 모듈

AFE1256EVM은 256채널 아날로그 프론트 엔드인 AFE1256 COF를 평가하기 위한 초소형 USB 기반 평가 키트입니다. 이 EVM은 DAC 및 온보드 패턴 생성기와 함께 자체 포함되어 있어 외부 장비에 대한 종속성을 크게 줄여서 전원 공급 장치로 사용할 수 있습니다. 이 키트는 EVM과 별도의 COF 어댑터로 구성되어 있으며 COF 장치의 성능을 평가할 수 있는 사용하기 쉬운 소프트웨어입니다. COF 어댑터는 탈착식이므로 단일 EVM 설정을 사용하여 여러 COF 어댑터를 평가할 수 있습니다. USB 2.0 인터페이스는 (...)

사용 설명서: PDF
지원되는 제품 및 하드웨어
패키지 CAD 기호, 풋프린트 및 3D 모델
COF (TDS) 314 Ultra Librarian
DIESALE (TD) Ultra Librarian

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