SN74AUP1G80
- Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
- ESD Performance Tested Per JESD 22
- 2000-V Human-Body Model
(A114-B, Class II) - 1000-V Charged-Device Model (C101)
- 2000-V Human-Body Model
- Available in the Texas Instruments NanoStar™ Package
- Low Static-Power Consumption
(ICC = 0.9 µA Maximum) - Low Dynamic-Power Consumption
(Cpd = 4.3 pF Typical at 3.3 V) - Low Input Capacitance (Ci = 1.5 pF Typical)
- Low Noise – Overshoot and Undershoot <10% of VCC
- Ioff Supports Partial-Power-Down Mode Operation
- Schmitt-Trigger Action Allows Slow Input Transition and Better Switching Noise Immunity at the Input
(Vhys = 250 mV Typical at 3.3 V) - Wide Operating VCC Range of 0.8 V to 3.6 V
- Optimized for 3.3-V Operation
- 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
- tpd = 4.4 ns Maximum at 3.3 V
- Suitable for Point-to-Point Applications
The AUP family is TI’s premier solution to the industry’s low-power needs in battery-powered portable applications. This family assures a low static- and dynamic-power consumption across the entire VCC range of 0.8 V to 3.6 V, resulting in increased battery life (see AUP – The Lowest-Power Family). This product also maintains excellent signal integrity (see Excellent Signal Integrity).
This is a single positive-edge-triggered D-type flip-flop. When data at the data (D) input meets the setup time requirement, the data is transferred to the Q output on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.
NanoStar™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs when the device is powered down. This inhibits current backflow into the device which prevents damage to the device.
관심 가지실만한 유사 제품
비교 대상 장치보다 업그레이드된 기능을 지원하는 즉각적 대체품
비교 대상 장치와 동일한 기능을 지원하는 핀 대 핀
기술 문서
검색된 결과가 없습니다. 검색어를 지우고 다시 시도하십시오.
모두 보기8 | 유형 | 직함 | 날짜 | ||
|---|---|---|---|---|
| * | Data sheet | SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop datasheet (Rev. F) | PDF | HTML | 2017/07/20 |
| Application note | Power-Up Behavior of Clocked Devices (Rev. B) | PDF | HTML | 2022/12/15 | |
| Application brief | Understanding Schmitt Triggers (Rev. A) | PDF | HTML | 2019/05/22 | |
| Selection guide | Little Logic Guide 2018 (Rev. G) | 2018/07/06 | ||
| Application note | Designing and Manufacturing with TI's X2SON Packages | 2017/08/23 | ||
| Selection guide | Logic Guide (Rev. AB) | 2017/06/12 | ||
| Application note | How to Select Little Logic (Rev. A) | 2016/07/26 | ||
| Application note | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004/07/08 |
설계 및 개발
추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.
평가 보드
5-8-LOGIC-EVM — 5핀~8핀 DCK, DCT, DCU, DRL 및 DBV 패키지용 일반 논리 평가 모듈
5~8핀 수의 DCK, DCT, DCU, DRL 또는 DBV 패키지가 있는 모든 디바이스를 지원하도록 설계된 유연한 EVM.
사용 설명서: PDF
레퍼런스 디자인
TIDA-01056 — EMI를 최소화하면서 전원 공급 장치의 효율을 최적화하는 20비트 1MSPS DAQ 레퍼런스 설계
This reference design for high performance data acquisition (DAQ) systems optimizes power stage in order to reduce power consumption and minimize the effect of EMI from switching regulator by using LMS3635-Q1 buck converter. This reference designs yields 7.2% efficiency improvement at most (...)
레퍼런스 디자인
TIDA-01054 — 고성능 DAQ 시스템에서 EMI 효과를 제거하는 다중 레일 전원 레퍼런스 디자인
The TIDA-01054 reference design helps eliminate the performance degrading effects of EMI on Data Acquisition (DAQ) systems greater than 16 bits with the help of the LM53635 buck converter. The buck converter enables the designer to place power solutions close to the signal path without the (...)
레퍼런스 디자인
TIDA-01055 — 고성능 DAQ 시스템을 위한 ADC 전압 레퍼런스 버퍼 최적화 레퍼런스 디자인
The TIDA-01055 reference design for high performance DAQ Systems optimizes the ADC reference buffer to improve SNR performance and reduce power consumption with the TI OPA837 high-speed op amp. This device is used in a composite buffer configuration and provides a 22% power improvement over (...)
레퍼런스 디자인
TIDA-01057 — 트루 10Vpp 차동 입력을 위해 신호 동적 범위를 20비트 ADC로 극대화하는 레퍼런스 설계
This reference design is designed for high performance data acquisition(DAQ) systems to improve the dynamic range of 20 bit differential input ADCs. Many DAQ systems require the measurement capability at a wide FSR (Full Scale Range) in order to obtain sufficient signal dynamic range. Many earlier (...)
레퍼런스 디자인
TIDA-01051 — 자동 테스트 장비에 대한 FPGA 활용률 및 데이터 처리량 최적화 레퍼런스 디자인
The TIDA-01051 reference design is used to demonstrate optimized channel density, integration, power consumption, clock distribution and signal chain performance of very high channel count data acquisition (DAQ) systems such as those used in automatic test equipment (ATE). Using serializers, such (...)
레퍼런스 디자인
TIDA-01050 — 18비트 SAR 데이터 컨버터를 위해 최적화된 아날로그 프론트 엔드 DAQ 시스템 레퍼런스 디자인
The TIDA-01050 reference design aims to improve the integration, power consumption, performance, and clocking issues typically associated with automatic test equipment. This design is applicable to any ATE system but most applicable to systems requiring a large number of input channels.
레퍼런스 디자인
TIDA-01052 — 음극 공급 장치를 사용하여 풀 스케일 THD를 개선하는 ADC 드라이버 레퍼런스 디자인
The TIDA-01052 reference design aims to highlight system performance increases seen using a negative voltage rail on the analog front end driver amplifiers rather than ground. This concept is relative to all analog front ends, however this design is aimed specifically at automatic test equipment.
| 패키지 | 핀 | 다운로드 |
|---|---|---|
| DSBGA (YFP) | 6 | 옵션 보기 |
| SOT-23 (DBV) | 5 | 옵션 보기 |
| SOT-SC70 (DCK) | 5 | 옵션 보기 |
| USON (DRY) | 6 | 옵션 보기 |
| X2SON (DPW) | 5 | 옵션 보기 |
| X2SON (DSF) | 6 | 옵션 보기 |
주문 및 품질
포함된 정보:
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
포함된 정보:
- 팹 위치
- 조립 위치