SN74HCT244-EP

Name: SN74HCT244-EP
Brand: TI
SKU: SN74HCT244-EP
Price: 1.296 USD

활성

TTL 호환 CMOS 입력 및 3상 출력을 지원하는 향상된 제품 8채널, 4.5V~5.5V 버퍼

지금 주문

데이터 시트

document-pdfAcrobat SN74HCT244-EP datasheet (영어)

SN74HCT244-EP

활성

데이터 시트

지금 주문

제품 상세 정보

Technology family

HCT

Supply voltage (min) (V)

4.5

Supply voltage (max) (V)

5.5

Number of channels

8

IOL (max) (mA)

6

Supply current (max) (µA)

80

IOH (max) (mA)

-6

Input type

TTL-Compatible CMOS

Output type

3-State

Features

Balanced outputs, Very high speed (tpd 5-10ns)

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-40 to 125

Technology family

HCT

Supply voltage (min) (V)

4.5

Supply voltage (max) (V)

5.5

Number of channels

8

IOL (max) (mA)

6

Supply current (max) (µA)

80

IOH (max) (mA)

-6

Input type

TTL-Compatible CMOS

Output type

3-State

Features

Balanced outputs, Very high speed (tpd 5-10ns)

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-40 to 125

TSSOP (PW)

20

41.6 mm² 6.5 x 6.4

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Operating Voltage Range of 4.5 V to 5.5 V
High-Current Inverting Outputs Drive Up To 15 LSTTL Loads
Low Power Consumption, 160-µA Max I_CC
Typical t_pd = 13 ns
±6-mA Output Drive at 5 V
Low Input Current of 1 µA Max
Inputs Are TTL-Voltage Compatible
3-State Outputs Drive Bus Lines or Buffer Memory Address Registers

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Operating Voltage Range of 4.5 V to 5.5 V
High-Current Inverting Outputs Drive Up To 15 LSTTL Loads
Low Power Consumption, 160-µA Max I_CC
Typical t_pd = 13 ns
±6-mA Output Drive at 5 V
Low Input Current of 1 µA Max
Inputs Are TTL-Voltage Compatible
3-State Outputs Drive Bus Lines or Buffer Memory Address Registers

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

This octal buffer and line driver is designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters. The SN74HCT244 device is organized as two 4-bit buffers/drivers, with separate output-enable (OE)\ inputs. When OE\ is low, the device passes noninverted data from the A inputs to the Y outputs. When OE\ is high, the outputs are in the high-impedance state.

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