제품 상세 정보

Technology family LS Number of channels 1 Operating temperature range (°C) 0 to 70 Rating Catalog Supply current (max) (µA) 10000
Technology family LS Number of channels 1 Operating temperature range (°C) 0 to 70 Rating Catalog Supply current (max) (µA) 10000
PDIP (N) 16 181.42 mm² 19.3 x 9.4 SOIC (D) 16 59.4 mm² 9.9 x 6 SOP (NS) 16 79.56 mm² 10.2 x 7.8

     

    '246, '247, 'LS247 feature

  • Open-Collector Outputs Drive Indicators Directly
  • Lamp-Test Provision
  • Leading/Trailing Zero Suppression

     

    'LS248 feature

  • Internal Pull-Ups Eliminate Need for External Resistors
  • Lamp-Test Provision
  • Leading/Trailing Zero Suppression
  • All Circuit Types Feature Lamp Intensity Modulation Capability

 

     

    '246, '247, 'LS247 feature

  • Open-Collector Outputs Drive Indicators Directly
  • Lamp-Test Provision
  • Leading/Trailing Zero Suppression

     

    'LS248 feature

  • Internal Pull-Ups Eliminate Need for External Resistors
  • Lamp-Test Provision
  • Leading/Trailing Zero Suppression
  • All Circuit Types Feature Lamp Intensity Modulation Capability

 

The '246 and '247 are electrically and functionally identical to the SN5446A/SN7446A, and SN5447A/SN7447A respectively, and have the same pin assignments as their equivalents. The 'LS247 and 'LS248 are electrically and functionally identical to the SN54LS47/SN74LS47 and SN54LS48/SN74LS48, respectively, and have the same pin assignments as their equivalents. They can be used interchangeably in present or future designs to offer designers a choice between two indicator fonts. The '46A, '47A, 'LS47, and 'LS48 compose the 6 and 9 the without tails and the '246, '247, 'LS247, and 'LS248 compose the and the with tails. Composition of all other characters, including display patterns for BCD inputs above nine, is identical. The '246, '247, and 'LS247 feature active-low outputs designed for driving indicators directly, and the 'LS248 features active-high outputs for driving lamp buffers. All of the circuits have full ripple-blanking input/output controls and a lamp test input. Segment identification and resultant displays are shown below. Display patterns for BCD input counts above 9 are unique symbols to authenticate input conditions.

All of these circuits incorporate automatic leading and/or trailing-edge zero-blanking control (RBI\ and RBO\). Lamp test (LT\) of these types may be performed at any time when the BI\/RBO\ node is at a high level. All types contain an overriding blanking input (BI) which can be used to control the lamp intensity by pulsing or to inhibit the outputs. Inputs and outputs are entirely compatible for use with TTL logic outputs.

Series 54 and Series 54LS devices are characterized for operation over the full military temperature range of -55°C to 125°C; Series 74 and Series 74LS devices are characterized for operation from 0°C to 70°C.

 

The '246 and '247 are electrically and functionally identical to the SN5446A/SN7446A, and SN5447A/SN7447A respectively, and have the same pin assignments as their equivalents. The 'LS247 and 'LS248 are electrically and functionally identical to the SN54LS47/SN74LS47 and SN54LS48/SN74LS48, respectively, and have the same pin assignments as their equivalents. They can be used interchangeably in present or future designs to offer designers a choice between two indicator fonts. The '46A, '47A, 'LS47, and 'LS48 compose the 6 and 9 the without tails and the '246, '247, 'LS247, and 'LS248 compose the and the with tails. Composition of all other characters, including display patterns for BCD inputs above nine, is identical. The '246, '247, and 'LS247 feature active-low outputs designed for driving indicators directly, and the 'LS248 features active-high outputs for driving lamp buffers. All of the circuits have full ripple-blanking input/output controls and a lamp test input. Segment identification and resultant displays are shown below. Display patterns for BCD input counts above 9 are unique symbols to authenticate input conditions.

All of these circuits incorporate automatic leading and/or trailing-edge zero-blanking control (RBI\ and RBO\). Lamp test (LT\) of these types may be performed at any time when the BI\/RBO\ node is at a high level. All types contain an overriding blanking input (BI) which can be used to control the lamp intensity by pulsing or to inhibit the outputs. Inputs and outputs are entirely compatible for use with TTL logic outputs.

Series 54 and Series 54LS devices are characterized for operation over the full military temperature range of -55°C to 125°C; Series 74 and Series 74LS devices are characterized for operation from 0°C to 70°C.

 

다운로드 스크립트와 함께 비디오 보기 동영상

관심 가지실만한 유사 제품

open-in-new 대안 비교
비교 대상 장치와 동일한 기능을 지원하는 핀 대 핀
CD74ACT138 활성 3라인-8라인 인버팅 디코더/디멀티플렉서 Shorter average propagation delay (8ns), higher average drive strength (24mA)

기술 자료

star =TI에서 선정한 이 제품의 인기 문서
검색된 결과가 없습니다. 검색어를 지우고 다시 시도하십시오.
10개 모두 보기
유형 직함 날짜
* Data sheet BCD-to-Seven-Segment Decoders/Drivers datasheet 1988/03/01
Selection guide Logic Guide (Rev. AB) 2017/06/12
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015/12/02
User guide LOGIC Pocket Data Book (Rev. B) 2007/01/16
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004/07/08
Application note TI IBIS File Creation, Validation, and Distribution Processes 2002/08/29
Application note Designing With Logic (Rev. C) 1997/06/01
Application note Designing with the SN54/74LS123 (Rev. A) 1997/03/01
Application note Input and Output Characteristics of Digital Integrated Circuits 1996/10/01
Application note Live Insertion 1996/10/01

설계 및 개발

추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.

평가 보드

14-24-LOGIC-EVM — 14핀~24핀 D, DB, DGV, DW, DYY, NS 및 PW 패키지용 로직 제품 일반 평가 모듈

14-24-LOGIC-EVM 평가 모듈(EVM)은 14핀~24핀 D, DW, DB, NS, PW, DYY 또는 DGV 패키지에 있는 모든 로직 장치를 지원하도록 설계되었습니다.

사용 설명서: PDF | HTML
TI.com에서 구매 불가
패키지 CAD 기호, 풋프린트 및 3D 모델
PDIP (N) 16 Ultra Librarian
SOIC (D) 16 Ultra Librarian
SOP (NS) 16 Ultra Librarian

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

지원 및 교육

TI 엔지니어의 기술 지원을 받을 수 있는 TI E2E™ 포럼

콘텐츠는 TI 및 커뮤니티 기고자에 의해 "있는 그대로" 제공되며 TI의 사양으로 간주되지 않습니다. 사용 약관을 참조하십시오.

품질, 패키징, TI에서 주문하는 데 대한 질문이 있다면 TI 지원을 방문하세요. ​​​​​​​​​​​​​​

동영상