SNIS244 September   2025 ISOTMP35R

ADVANCE INFORMATION  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Insulation Specification
    6. 5.6  Power Ratings
    7. 5.7  Safety-Related Certifications
    8. 5.8  Safety Limiting Values
    9. 5.9  Electrical Characteristics
    10. 5.10 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Features Description
      1. 6.3.1 Integrated Isolation Barrier and Thermal Response
      2. 6.3.2 Analog Output
        1. 6.3.2.1 Output Accuracy
        2. 6.3.2.2 Drive Capability
        3. 6.3.2.3 Common Mode Transient Immunity (CMTI)
      3. 6.3.3 Thermal Response
    4. 6.4 Device Functional Modes
  8. 7 Application and Implementation
    1. 7.1 Application Information
      1. 7.1.1 External Buffer
      2. 7.1.2 ADC Interface Considerations
      3. 7.1.3 Electromagnetic Noise Mitigation
        1. 7.1.3.1 Filtering Techniques
        2. 7.1.3.2 General Design Guidelines
        3. 7.1.3.3 PCB Layout Practices
      4. 7.1.4 Insulation Lifetime
    2. 7.2 Power Supply Recommendations
      1. 7.2.1 PSRR Considerations
    3. 7.3 Layout
      1. 7.3.1 Layout Guidelines
      2. 7.3.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Documentation Support
      1. 8.1.1 Related Documentation
    2. 8.2 Receiving Notification of Documentation Updates
    3. 8.3 Support Resources
    4. 8.4 Trademarks
    5. 8.5 Electrostatic Discharge Caution
    6. 8.6 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
  • DFP|12
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.1.4 Insulation Lifetime

Insulation lifetime projection data is collected by using the industry-standard time-dependent dielectric breakdown (TDDB) test method. In this test, all pins on each side of the barrier are tied together, creating a two-terminal device, and high voltage is applied between the two sides. See Figure 7-4 for TDDB test setup. The insulation breakdown data is collected at various high voltages, switching at 60Hz over temperature.

ISOTMP35R Test Setup for Insulation Lifetime MeasurementFigure 7-4 Test Setup for Insulation Lifetime Measurement