SLAAED9 November 2023 TAA5412-Q1 , TAC5311-Q1 , TAC5312-Q1 , TAC5411-Q1 , TAC5412-Q1
In addition to the latched and live fault registers, the raw data used for fault calculation is stored in diagnostic monitoring registers (P1_R86 to P1_R113). These registers provide voltage readings for each of the input channels, VBAT_IN, and MICBIAS as well as the MICBIAS load and internal die temperature. The MICBIAS load and die temperature registers have unique transfer functions detailed in the following sections. These registers can be used to bypass the on-chip fault processing and develop unique fault algorithms from the raw data. The registers are also useful during system debug.